Photoluminescence results on silicon-doped indium selenide are reported. The effect of tcmperature and excitation intensity is studied. At low temperature, free and neutral donor bound exciton peaks are observed. Above 100 K only free exciton and band-to-band photoluminescence is detected. In order to give account of the full lineshape as a function of the absorption coefficient, the Urbach absorption tail of InSe is measured. Transmission and reflection photoluminescence spectra are also compared in order to study the effect of carrier diffusion. The shape of the photoluminescence spectrum can be accounted for through a direct gap model.
ExperimentalThe InSe crystals used in this study were grown by the Bridgman method [19, 201 from a non-stoichiometric melt Inl,05Seo,95, to which different amounts of Si were added. For the ') Camino de Vera,