2015
DOI: 10.1016/j.jallcom.2014.11.221
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Photoluminescence related to Gd3+:N-vacancy complex in GaN:Gd multi-quantum wells

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Cited by 8 publications
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“…Reflection high-energy electron diffraction (RHEED) patterns show a reconstructed surface pattern (7 × 7) for the Si substrates. Elemental Ga, Al, and RF plasma-enhanced N 2 were used as sources, which is a clean method for growing high-purity structures with very good crystalline quality. We can exclude the existence of any phonon mode associated with lattice disorder, breakdown of the translational symmetry, or defects. The growth of the GaN NWs was performed under an N -rich condition with a Ga-to-N ratio of 1:3.…”
mentioning
confidence: 99%
“…Reflection high-energy electron diffraction (RHEED) patterns show a reconstructed surface pattern (7 × 7) for the Si substrates. Elemental Ga, Al, and RF plasma-enhanced N 2 were used as sources, which is a clean method for growing high-purity structures with very good crystalline quality. We can exclude the existence of any phonon mode associated with lattice disorder, breakdown of the translational symmetry, or defects. The growth of the GaN NWs was performed under an N -rich condition with a Ga-to-N ratio of 1:3.…”
mentioning
confidence: 99%