Our system is currently under heavy load due to increased usage. We're actively working on upgrades to improve performance. Thank you for your patience.
2014
DOI: 10.1002/pssb.201451285
|View full text |Cite
|
Sign up to set email alerts
|

Photoluminescence of Si nanocrystals embedded in : Excitation/emission mapping

Abstract: Time‐resolved photoluminescence from Si nanocrystals produced by 1100∘C thermal annealing of SiOx/SiO2 multilayers were investigated by tunable laser excitation, achieving a detailed excitation/emission pattern in the visible and UV range. The emission lineshape is a gaussian curve inhomogenously broadened because of the size distribution of Si nanocrystals, the excitation spectrum consists of the overlap of two gaussian bands centered around 3.4 and 5.1 eV. The mapping of luminescence spectral components with… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1

Citation Types

1
6
0

Year Published

2015
2015
2023
2023

Publication Types

Select...
8

Relationship

2
6

Authors

Journals

citations
Cited by 19 publications
(7 citation statements)
references
References 44 publications
(60 reference statements)
1
6
0
Order By: Relevance
“…Figure 2(b) shows the PLE spectra of the SRO 20 films, where two main peaks at about 290 and 360 nm are observed. Excitation bands at ∼360 and ∼290 nm have been related to Γ 25 →Γ 15 and Γ 25 →Γ 2′ optical direct transitions in bulk silicon, respectively [20][21][22][23]. As observed in figure 2(b), there is a clear blue-shift of the PLE band related to the Γ 25 →Γ 2′ direct transition as the annealing temperature increases.…”
Section: Resultsmentioning
confidence: 77%
See 1 more Smart Citation
“…Figure 2(b) shows the PLE spectra of the SRO 20 films, where two main peaks at about 290 and 360 nm are observed. Excitation bands at ∼360 and ∼290 nm have been related to Γ 25 →Γ 15 and Γ 25 →Γ 2′ optical direct transitions in bulk silicon, respectively [20][21][22][23]. As observed in figure 2(b), there is a clear blue-shift of the PLE band related to the Γ 25 →Γ 2′ direct transition as the annealing temperature increases.…”
Section: Resultsmentioning
confidence: 77%
“…For the SRO 20 films, the PL intensity increases as the annealing temperature increases, with the highest emission obtained for the one thermally annealed at 1100 °C. The red-shift of the main PL peak has been widely observed and is ascribed to the agglomeration of excess silicon and subsequent silicon nanoparticle formation as a result of the thermal annealing process [4,16,19,20]. Nevertheless, besides the Si agglomeration, some point defects can also exist within the SRO films.…”
Section: Resultsmentioning
confidence: 99%
“…Figure shows PL decay curves of the SiO x /Al 2 O 3 bare structure taken at different pump intensities in the range 7–4000 µW that corresponds to the linear mode . The decay curves have been measured at 1.70 eV, i.e., at the maximum of the PL peak.…”
Section: Resultsmentioning
confidence: 99%
“…An interesting suggestion derives from past studies performed on γ-irradiated oxygen deficient silica where a PL around 1.8 eV has been observed under 2.5 eV excitation; this PL has been associated with highly oxygen deficient states due to Si clusters [28]. This attribution is justified by the knowledge of the extensively investigated Si-nanocrystals embedded in silica which are characterized by a red PL: its position depends on the crystal size, its lifetime occurs in the μs timescale and its PLE extends in the visible-UV range [29][30][31][32]. This emission is attributed to both the quantum confinement of excitons and localized defects states at the Si/SiO 2 interface [33,34].…”
Section: Red Emissionmentioning
confidence: 95%