“…XPS analysis of Si-NPs indicated a Si–O bonding surface coverage without other surface contamination. , (Figure S9) FTIR studies confirmed the oxidized surface of Si-NPs with features that are similar to those obtained using different approaches. ,, (Figure D) The main band (1070 cm –1 ) is due to Si–O–Si optical mode covering the particles . Numerous sharp peaks located at 800 cm –1 , 880 and 960 cm –1 corresponding to various SiOx bending mode, nonbridging Si–O bonds, Si–O–Si bonds, and Si–OH bending were observed. Moreover, transitions were seen around 1630, 2260, and in the range 3200–3650 cm –1 , attributed to SiO–H bending, OxSi-H vibrations modes, and the O–H vibrational modes, respectively (Figure S10).…”