2017 IEEE 44th Photovoltaic Specialist Conference (PVSC) 2017
DOI: 10.1109/pvsc.2017.8521507
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Photoluminescence imaging analysis of doping in thin film CdS and CdS/CdTe devices

Abstract: The use of photoluminescence (PL) imaging analysis to assess the effectiveness of the passivation treatment due to the presence of chlorine in CdS thin films has been investigated. In this work, we show that the chlorine doping effect in the CdS window layer can be detected by PL imaging analysis, due to the formation of a defect complex of sulfur vacancy and ClS (VS-ClS) and complexes between halogen ions and cadmium vacancies (VCd-ClS). CdTe devices with differently doped CdS layers were investigated. PL ima… Show more

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“…Zn 3 P 2 , Na 2 Te, Na 2 Se, K 2 S, Sb, Cd 3 P 2 , and In with excimer laser for both p-and n-type CdTe [163]. As, Cu, P and in situ Sb, As, P for CdTe are found a promising way for engineering the optical and electrical properties of corresponding II-VI Semiconductors [164][165][166][167][168][169][170][171][172][173]. According to the doping strategies based on time, most of these aforementioned doping is named doping during synthesis.…”
Section: Doping Of Ii-vi Semiconductors and Compoundsmentioning
confidence: 99%
“…Zn 3 P 2 , Na 2 Te, Na 2 Se, K 2 S, Sb, Cd 3 P 2 , and In with excimer laser for both p-and n-type CdTe [163]. As, Cu, P and in situ Sb, As, P for CdTe are found a promising way for engineering the optical and electrical properties of corresponding II-VI Semiconductors [164][165][166][167][168][169][170][171][172][173]. According to the doping strategies based on time, most of these aforementioned doping is named doping during synthesis.…”
Section: Doping Of Ii-vi Semiconductors and Compoundsmentioning
confidence: 99%