Photoluminescence, FTIR and X-ray diffraction studies on undoped and Al-doped ZnO thin films grown on polycrystalline α-alumina substrates by ultrasonic spray pyrolysis

Djelloul, A.; Aida, M.S.; Bougdira, J.

doi:10.1016/j.jlumin.2010.06.002

Cited by 101 publications

(34 citation statements)

References 20 publications

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“…Figure 4 shows the reflection FTIR spectra of ZnO films obtained at different substrate temperatures. Despite the fact that the films were obtained by a chemical method, the infrared reflectance spectra are quite "clean" for ZnO films deposited at T s > 573 K. In the low-frequency region of 460-475 cm À1 , the reflectance minimum similar to the data in the literature [37][38][39] is attributed to the Zn-O vibration mode (Fig. 4b).…”

Section: Ftir Spectroscopysupporting

confidence: 53%

Substructural investigations, Raman, and FTIR spectroscopies of nanocrystalline ZnO films deposited by pulsed spray pyrolysis

Dobrozhan

Opanasyuk

Kolesnyk

et al. 2015

Physica Status Solidi (a)

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Nanocrystalline ZnO films were deposited onto glass substrates in the temperature range of 473-673 K using pulsed spray pyrolysis. The structural, substructural, and optical properties of the films were investigated by means of X-ray diffraction analysis, Raman scattering, and Fourier transform infrared (FTIR) spectroscopy. The effect of the substrate temperature (T s ) on the coherent scattering domain (CSD) sizes L, microstrains e, and microstress s grades, and the average density of dislocations r in the films were estimated through the broadening of X-ray lines using the Cauchy and Gauss approximations and the threefold function convolution method. The ZnO films grown at T s ¼ 623-673 K possessed the highest values of L, and the lowest of e, s, and r, indicating high-crystalline quality. The Raman spectra showed peaks located at 95-98, 333-336, 415, 439-442, 572, and 578-584 cm À1 , which were interpreted as E 2 low (Zn), (E 2 high ÀE 2 low ), E 1 (TO), E 2 high (O), A 1 (LO) and E 1 (LO) phonon modes of the ZnO wurtzite phase. The FTIR spectra showed relatively weak signals at 856, 1405, and 1560 cm À1 , corresponding to the C-H and C-O stretching modes, in addition to the main Zn-O mode at 475 cm À1 , indicating a low content of precursor residues.

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Section: Ftir Spectroscopysupporting

confidence: 53%

Substructural investigations, Raman, and FTIR spectroscopies of nanocrystalline ZnO films deposited by pulsed spray pyrolysis

Dobrozhan

Opanasyuk

Kolesnyk

et al. 2015

Physica Status Solidi (a)

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“…These peaks correlate well with the observed frequencies of the CH3 asymmetric stretching (2962±10 cm -1 ), CH2 asymmetric stretching (2926±10 cm -1 ) and the CH2 symmetric stretching (2855±10 cm -1 ), respectively [8]. The peak centred at 1460 cm -1 corresponds to the CH3 and CH2 deformation vibrations and can be seen in all spectra [8].…”

Section: Ftir Analysissupporting

confidence: 80%

Nanocrystalline ZnO Thin Films – Influence of Sol-gel Conditions on the Underlying Chemistry and Film Microstructure and Transparency

Maia

Ochoa

Portugal

et al. 2015

Materials Today: Proceedings

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“…Lavrov et al [47] reported that the theoretical calculations predicted O-H vibrations in ZnO ranging from 3,216 to 3,644 cm -1 . The emergence of the band at 565 cm -1 [48] confirms the incorporation of Al in the ZnO lattice. In addition to this, a weaker band appears at 968 cm -1 confirms the existence of Al-O stretching mode, only at heavily doped nanocrystalline ZnO:Al powder (20 at.%) [49][50][51].…”

Section: Fourier Transform Infrared (Ftir) Analysismentioning

confidence: 67%

Synthesis of heavily doped nanocrystalline ZnO:Al powders using a simple soft chemical method

Saravanakumar¹,

Ravichandran²

2012

J Mater Sci: Mater Electron

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Aluminum doped nanocrystalline zinc oxide powders were synthesized using a simple soft chemical method from precursor solutions having different Al doping levels (0-20 at.% in steps of 5 at.%). X-ray diffraction studies showed that the product has pure hexagonal wurtzite structure without any secondary phases such as Al 2 O 3 and ZnAl 2 O 4 etc. The preferential orientation plane was found to be (101) for all the samples irrespective of the Al doping level. But the degree of crystallinity of the powder gradually decreased as the doping level increased. The SEM images revealed that the crystals have hexagonal prism like structure when the Al doping level was 5 at.% and the shape changes gradually and attains a thread like structure for heavy doping. The EDAX and FTIR studies confirmed the proper incorporation of Al 3? ions in the Zn 2? sites of the ZnO lattice even in the heavily doped powders. The optical band gap increased remarkably (from 3.12 to 3.48 eV) with the increase in the Al doping level.

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Photoluminescence, FTIR and X-ray diffraction studies on undoped and Al-doped ZnO thin films grown on polycrystalline α-alumina substrates by ultrasonic spray pyrolysis

Cited by 101 publications

References 20 publications

Substructural investigations, Raman, and FTIR spectroscopies of nanocrystalline ZnO films deposited by pulsed spray pyrolysis

Substructural investigations, Raman, and FTIR spectroscopies of nanocrystalline ZnO films deposited by pulsed spray pyrolysis

Nanocrystalline ZnO Thin Films – Influence of Sol-gel Conditions on the Underlying Chemistry and Film Microstructure and Transparency

Synthesis of heavily doped nanocrystalline ZnO:Al powders using a simple soft chemical method

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