2016
DOI: 10.1109/jphotov.2016.2547583
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Photoluminescence-Based Current–Voltage Characterization of Individual Subcells in Multijunction Devices

Abstract: -We demonstrate a photoluminescence based, contactless method to determine the current-voltage characteristics of the individual subcells in a multi-junction solar cell. The method relies upon the reciprocity relation between the absorption and emission properties on a solar cell. Laser light with a suitable energy is used to excite carriers selectively in one junction and the internal voltages are deduced from the intensity of the resulting luminescence. The IV curves obtained this way on 1J, 2J and 6J device… Show more

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Cited by 18 publications
(9 citation statements)
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“…To estimate the pseudo-J-V curves of the subcells, we performed absolute electroluminescence (EL) imaging, where the excess charge carriers are generated electrically to access the subcell characteristics (65)(66)(67)(68). For each injected current, an EL image was recorded, from which the voltage of the subcells can be calculated from an average over the active area (Figure S36).…”
Section: Subcell J-v Characteristics Of a Monolithic Tandem Solar Cellmentioning
confidence: 99%
“…To estimate the pseudo-J-V curves of the subcells, we performed absolute electroluminescence (EL) imaging, where the excess charge carriers are generated electrically to access the subcell characteristics (65)(66)(67)(68). For each injected current, an EL image was recorded, from which the voltage of the subcells can be calculated from an average over the active area (Figure S36).…”
Section: Subcell J-v Characteristics Of a Monolithic Tandem Solar Cellmentioning
confidence: 99%
“…In the experiment, these voltages are obtained from the luminescence measurements, as discussed in Ref. [12].…”
Section: Calculation Of the Currents And Voltagesmentioning
confidence: 99%
“…In a previous work, we used photoluminescence spectroscopy as a contactless, fast method to evaluate the current-voltage (IV) characteristics of each junction in MJ devices, estimating the solar cell characteristics such as open circuit voltage (V oc ) or fill factor (FF) [12]. Such contactless technique allows for a fast screening of devices in the industry environment as well as tool for early diagnosis of the quality of the epitaxial process, given that a full device structure is not necessary.…”
Section: Introductionmentioning
confidence: 99%
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“…Characterization for low-power solar cells is found extensively both in literature [13][14][15][16] with several low-power single cell/module characterization devices available in industry. The focus of the above-mentioned cell-level characterization is typically in the early design and performance validation stages of the PV device development [17,18]. However, high-power PV array characterization in the range of kilo Watts is not as widely available due to challenges posed by thermal losses in electronic components [19].…”
Section: Introductionmentioning
confidence: 99%