1993
DOI: 10.1016/0022-2313(93)90121-3
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Photoluminescence and optically detected magnetic resonance investigations on porous silicon

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Cited by 20 publications
(15 citation statements)
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“…Several authors have already identified the P,-defect (a silicon dangling bond at the Si/SiOz interface) as the major defect in porous Si [4,5]. Fig.…”
Section: Resultsmentioning
confidence: 99%
“…Several authors have already identified the P,-defect (a silicon dangling bond at the Si/SiOz interface) as the major defect in porous Si [4,5]. Fig.…”
Section: Resultsmentioning
confidence: 99%
“…The 0.9 eV peak is generally assigned to the recombination of photoexcited carriers via Si dangling bonds at the interfaces between nc-Si and SiO 2 matrices ͑Si P b centers͒. [15][16][17][18] The intensity of this peak shows the same Ge concentration dependence as that of the main band. The integrated PL intensities of the 0.9 and 1.4 eV peaks at 10 K are shown in Fig.…”
Section: Methodsmentioning
confidence: 94%
“…Similar to the main peak, the lowenergy peak exhibits a size-dependent shift. However, the amount of the shift is about half that of the main peak [3,[51][52][53][54]. The size-dependent shift of the low-energy peak is considered to reflect that of the conduction band edge.…”
Section: Fundamental Propertiesmentioning
confidence: 99%