Photoionization cross sections and photoelectron angular distributions for x-ray line energies in the range 0.132–4.509 keV targets: 1 ≤ Z ≤ 100

Band, I.M.; Kharitonov, Yu.I.; Trzhaskovskaya, M. B.

doi:10.1016/0092-640x(79)90027-5

Cited by 364 publications

(125 citation statements)

References 17 publications

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“…The relativistic results are based on the Dirac-Fock-Slater method [58] and summed over different total angular momentum j to make a com- [53,59,60] and recommended values from various experiments and theories [61]. Bearing in mind some limitations of the nonrelativistic treatment for heavy atoms, the present results are in fair agreement with other available values.…”

Section: Resultssupporting

confidence: 76%

Monte Carlo calculation of ion, electron, and photon spectra of xenon atoms in x-ray free-electron laser pulses

Son

Santra

2012

Phys. Rev. A

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When atoms and molecules are irradiated by an x-ray free-electron laser (XFEL), they are highly ionized via a sequence of one-photon ionization and relaxation processes. To describe the ionization dynamics during XFEL pulses, a rate equation model has been employed. Even though this model is straightforward for the case of light atoms, it generates a huge number of coupled rate equations for heavy atoms like xenon, which are not trivial to solve directly. Here, we employ the Monte Carlo method to address this problem and we investigate ionization dynamics of xenon atoms induced by XFEL pulses at a photon energy of 4500 eV. Charge state distributions, photo-/Auger electron spectra, and fluorescence spectra are presented for x-ray fluences of up to 10 13 photons/µm 2 . With the photon energy of 4500 eV, xenon atoms can be ionized up to +44 through multiphoton absorption characterized by sequential one-photon single-electron interactions.

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Section: Resultssupporting

confidence: 76%

Monte Carlo calculation of ion, electron, and photon spectra of xenon atoms in x-ray free-electron laser pulses

Son

Santra

2012

Phys. Rev. A

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“…The results of Seah et al 8 support the cross-sections of Scofield 20 and Band et al 21 Except for the 4f lines, the values of Band et al 21 were used in our investigations. By comparative studies we found the values Au4f 1486.6 eV D 14.2 and The kinetic energies were estimated by peak fitting.…”

supporting

confidence: 83%

“…Figure 4 illustrates the results of the standard peak fit for spectra recorded with the Escalab 220 iXL (monochromatized Al K˛radiation, E D 50 eV, LAX) and applying the iteratively calculated background B E from Eqn. (21). Even for Ge spectra exhibiting a strong loss structure, acceptable results were obtained.…”

Section: Peak Area Estimationmentioning

confidence: 98%

Improved accuracy of quantitative XPS analysis using predetermined spectrometer transmission functions with UNIFIT 2004

Hesse

Streubel

Szargan

2005

Surface & Interface Analysis

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“…25 The measured XPS spectra were corrected for the electron-energy-dependent analyzer energy window and detector efficiency, with the energy dependence for the IMFPs approximated as 26 E 0.75 , the asymmetry parameters describing the angular distribution of the detected photoelectrons and the respective subshell photoionization cross-sections. 27 The surface concentrations recorded before and after the EPES measurement were similar, which indicated no appreciable radiation effect. Values of surface concentrations resulting from the quantitative analysis were corrected for the presence of hydrogen, recalculating the XPS-measured concentrations with C : H ratios for an ideal composition polymer.…”

Section: Xps Helium Pycnometry and Afm Analysismentioning

confidence: 79%

Morphology, surface roughness, electron inelastic and quasielastic scattering in elastic peak electron spectroscopy of polymers

Lesiak

Kosinski

Nowakowski

et al. 2007

Surface & Interface Analysis

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In elastic peak electron spectroscopy (EPES), the nearest vicinity of elastic peak in the low kinetic energy region reflects electron inelastic and quasielastic processes. Incident electrons produce surface excitations, inducing surface plasmons, with the corresponding loss peaks separated by 1-20 eV energy from the elastic peak.In this work, X-ray photoelectron spectroscopy (XPS) and helium pycnometry are applied for determining surface atomic composition and bulk density, whereas atomic force microscopy (AFM) is applied for determining surface morphology and roughness. The component due to electron recoil on hydrogen atoms can be observed in EPES spectra for selected primary electron energies. Simulations of EPES predict a larger contribution of the hydrogen component than observed experimentally, where hydrogen deficiency is observed. Elastic peak intensity is influenced more strongly by surface morphology (roughness and porosity) than by surface excitations and quasielastic scattering of electrons by hydrogen atoms.

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Photoionization cross sections and photoelectron angular distributions for x-ray line energies in the range 0.132–4.509 keV targets: 1 ≤ Z ≤ 100

Cited by 364 publications

References 17 publications

Monte Carlo calculation of ion, electron, and photon spectra of xenon atoms in x-ray free-electron laser pulses

Monte Carlo calculation of ion, electron, and photon spectra of xenon atoms in x-ray free-electron laser pulses

Improved accuracy of quantitative XPS analysis using predetermined spectrometer transmission functions with UNIFIT 2004

Morphology, surface roughness, electron inelastic and quasielastic scattering in elastic peak electron spectroscopy of polymers

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