Fragmentation patterns and dissociation rates of state-selected NO 2 + ions were measured by the threshold photoelectron-photoion coincidence (TPEPICO) method in the region of 40-100 nm. Parent NO 2 + ions were detected when they were prepared in the excited states located above the first dissociation limit (D 0 0 ) 2.79 eV), correlating to NO + (X 1 Σ + ) + O( 3 P). Specially, the dissociation rate (k dis ) of NO 2 + ions in the lowest excited a ˜3B 2 state increases with increasing the quantum number of the bending vibration (n 2 ): (7.4 ( 4.9) × 10 2 , (1.32 ( 0.56) × 10 3 , (1.51 ( 0.40) × 10 4 , and (2.38 ( 0.51) × 10 4 s -1 for n 2 ) 0, 1, 2, and 3, respectively. The branching ratios of two dissociation pathways, NO + + O and O + + NO, were found to depend on the electronic state of the parent ion. The unimolecular dissociation channels are discussed in terms of dissociation potential surfaces open for individual electronic states and radiative relaxation to lower electronic states.