Handbook of Materials Characterization 2018
DOI: 10.1007/978-3-319-92955-2_12
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Photoelectron Spectroscopy: Fundamental Principles and Applications

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Cited by 3 publications
(3 citation statements)
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“…Fourier transform infrared spectroscopy (FT-IR ) is a common instrumental tool used for the identi cation of several functional groups of any organic material (liquids, solids, and gases) by the measurement and determination of its emission spectra or infrared absorption [39]. The impact of CIP adsorption onto C. vulgaris and Synechocystis sp.…”
Section: Ftirmentioning
confidence: 99%
“…Fourier transform infrared spectroscopy (FT-IR ) is a common instrumental tool used for the identi cation of several functional groups of any organic material (liquids, solids, and gases) by the measurement and determination of its emission spectra or infrared absorption [39]. The impact of CIP adsorption onto C. vulgaris and Synechocystis sp.…”
Section: Ftirmentioning
confidence: 99%
“…PES is based on the photoelectric effect in which the photoelectrons are excited from the sample surface during the irradiation by X‐ray (i.e., X‐ray PES, XPS) or by ultraviolet light (i.e., ultraviolet PES, UPS) and the electronic structure of the samples is obtained from the measured kinetic energies of the photoelectrons. [ 16,17 ] The XPS can provide chemical information of the sample surface, but it is not suitable for the accurate measurement of the valence‐band structure mainly due to its low energy resolution. [ 18–20 ] Contrary to XPS, UPS can provide more precise information about the valence band structure.…”
Section: Introductionmentioning
confidence: 99%
“…The peak positions in all the SXPES and HAXPES spectra are nearly identical despite the significantly different electron inelastic mean free path of electrons excited by the soft and hard x-rays that we employed. 26 The spectral weight in the valence band spectra is yet different between SXPES and HAXPES [Figs. 2(c) and 2(d)].…”
mentioning
confidence: 99%