An influence of laser-induced stress and shock waves on photoelectric properties of epitaxial n-Cd 0.28 Hg 0.72 Te (CMT) films with a cellular structure was studied. Irradiation of CMT films with nanosecond ruby laser pulses resulted in a modification of photoconductivity spectra and an increase in the photosensitivity because of segregation of electrically active point defects at the cell boundaries (acting as sinks) and also because of changes in their electron states as a result of action of the laser-generated stress and shock waves. Using the calculations of the temperature of the samples, the depth of shock wave formation and the amplitude of shock wave at laser irradiation, it was established that the strongest photosensitization of CMT took place in deep-seated layers where the shock wave was formed. This deduction was confirmed by an increase in the photosensitivity of purpose-designed samples coated with copper foil in such a way as to exclude the photo-and thermal effects under laser irradiation of CMT solid solutions.