2016
DOI: 10.1021/acsami.6b02497
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Photoelectric Property Modulation by Nanoconfinement in the Longitude Direction of Short Semiconducting Nanorods

Abstract: Photoelectric property change in half-dimensional (0.5D) semiconducting nanomaterials as a function of illumination light intensity and materials geometry has been systematically studied. Through two independent methods, conductive atomic force microscopy (C-AFM) direct current-voltage acquisition and scanning kelvin probe microscopy (SKPM) surface potential mapping, photoelectric property of 0.5D ZnO nanomaterial has been characterized with exceptional behaviors compared with bulk/micro/one-dimensional (1D) n… Show more

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Cited by 14 publications
(6 citation statements)
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References 43 publications
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“…Among these SPM techniques, conductive atomic force microscopy (CAFM) has been successfully applied to study the conductive properties on single or individual nanostructures [30][31][32]. CAFM investigations on a variety of nanowires, such as ZnO, InAs, CdS, CdSe, GaAs, InAsSb, and Si NWs, have already been reported [33][34][35][36][37][38]. While most researches focused on the conductive properties of nanowires with fixed parameters, some investigations were carried out to explore the doping dependence of conductive properties [37][38][39].…”
Section: Introductionmentioning
confidence: 99%
“…Among these SPM techniques, conductive atomic force microscopy (CAFM) has been successfully applied to study the conductive properties on single or individual nanostructures [30][31][32]. CAFM investigations on a variety of nanowires, such as ZnO, InAs, CdS, CdSe, GaAs, InAsSb, and Si NWs, have already been reported [33][34][35][36][37][38]. While most researches focused on the conductive properties of nanowires with fixed parameters, some investigations were carried out to explore the doping dependence of conductive properties [37][38][39].…”
Section: Introductionmentioning
confidence: 99%
“…[4]. So, given the length-dependent OAC, it is easy to recognize that the adsorbed oxygen density N s on a ZnO NW surface increases when its length increases, leading to an increase in the density of captured electrons which can be proved by the scanning results of surface potential in the report [5].…”
Section: The Procedures Of Modelmentioning
confidence: 85%
“…A peak appeared naturally in the photocurrent-length curve. In addition, they made some supplemental works, such as the research that the lengthdependent photoinduced electron density from the surface of a ZnO NW which originates from the desorption of electrons confined in the NW surface [5], to improve their theory. It seems that this interesting phenomenon has been explained well.…”
Section: Introductionmentioning
confidence: 99%
“…Besides the studies applying single nanowire devices which is not easy to fabricate, scanning probe microscopy (SPM)-based electrical measurements have revealed themselves as powerful techniques for electrical characterizations at nanoscale [14,15]. Among these SPM techniques, conductive atomic force microscopy (CAFM) has been most often applied to study the conductive properties of individual nanostructures such as films, heterostructures as well as nanowires [16][17][18][19][20]. By combining with laser irradiation, it can be modified as photoconductive atomic force microscopy (PCAFM) which provides a route to investigate the photoconductive properties on individual nanostructures [21,22].…”
Section: Introductionmentioning
confidence: 99%