different effect on device performance depending on the morphology of the active layer. We investigate this infl uence of morphology in the context of two fundamental mechanisms that are able to cause a V oc loss. First, an increased trap-assisted recombination rate that lowers the charge carrier density [ 2,3 ] and second a broadening of the density of states that reduces V oc [ 4,5 ] with the same charge carrier density and unchanged recombination dynamics. Answering this question is important not only for making more stable solar cells, but also for understanding in general how traps reduce the open-circuit voltage in organic solar cells. Aging is a convenient way to add traps into an organic solar cell and see their effect on recombination and V oc without introducing additional materials into the active layer.We illuminate BHJ solar cells of various materials in inert conditions for three days. Using transient photovoltage (TPV), [ 6 ] charge extraction (CE) [ 7 ] and temperature dependent measurements of the opencircuit voltage, we compare the recombination dynamics and charge carrier densities of fresh and aged solar cells and relate them to the observed V oc losses. We find that in degraded solar cells of amorphous materials such as poly[9′hepta-decanyl-2,7-carbazole-alt-5,5-(4′,7′-di-2-thienyl-2′,1′,3′benzothiadiazole)] (PCDTBT), the recombination dynamics are basically unchanged. Instead, the observed open-circuit voltage losses appear to result from increased energetic disorder that causes a change in the relevant low-energy portion of the density of states such that for the same charge carrier density a lower quasi Fermi level splitting is obtained. We observe that solar cells made from crystalline materials do not show V oc losses and have a higher charge carrier density than solar cells made from amorphous materials. Apparently crystalline materials are not affected by a moderate increase of energetic disorder, most likely due to a higher charge carrier density.Besides reduced open-circuit voltages, also losses of fi ll factor [ 1,8 ] and short-circuit current [ 9,10 ] are observed upon burnin. Often a convolution of degradation mechanisms at material interfaces and within the bulk of the absorbing layer is present. Recent work suggests that a decrease in fi ll factor during degradation is related to interface defects [ 1,8 ] which are most likely related to injection or extraction barriers at the electrodes. [11][12][13] The photoinduced open-circuit voltage ( V oc ) loss commonly observed in bulk heterojunction organic solar cells made from amorphous polymers is investigated. It is observed that the total charge carrier density and, importantly, the recombination dynamics are unchanged by photoinduced burn-in. Charge extraction is used to monitor changes in the density of states (DOS) during degradation of the solar cells, and a broadening over time is observed. It is proposed that the V oc losses observed during burn-in are caused by a redistribution of charge carriers in a broader DOS. The tempe...