“…Light-induced advanced oxidation processes have demonstrated good development prospects in the area of emission reduction of NO x and SO 2 from flue gas. ,,,,,− Several semiconductor-based photocatalytic oxidation processes have been developed for removal of NO x and SO 2 from flue gas and have exhibited good removal performance for NO x and SO 2 . ,− However, some drawbacks, such as instability and low activity of photocatalyst, low penetration of UV light in solids, and restriction of low concentrations of pollutants (photocatalytic oxidation processes can be only used for the treatment of pollutants with low concentration), hinder their industrial applications. , In recent years, several photochemical oxidation processes, such as dry VUV radiation, ,− wet UV–H 2 O 2 ,, and wet UV–Fenton(-like) processes, ,, have been developed to remove NO x and SO 2 from flue gas. Tsuji et al − successfully used 172 nm Xe 2 and 146 nm Kr 2 excimer lamps as VUV sources to remove SO 2 , NO, and NO 2 in N 2 and air without using any expensive catalysts, which shows that VUV is an effective light source for the removal of SO 2 , NO, and NO 2 . However, Tsuji’s studies − did not consider the effect of VUV irradiation in the simultaneous presence of O 2 and H 2 O, which are the two main components of actual flue gases.…”