Amorphous hydrogenated silicon suboxides (a-SiO x :H) were deposited by plasma enhanced chemical vapor deposition from the source gases SiH 4 , H 2 , and CO 2. The band gap of the samples can be tuned from 1.9 to 3.0 eV by varying the oxygen content from 0 to 50 at. %. H-effused samples were irradiated by ultraviolet laser pulses with intensities up to 480 mJ/cm 2. The structural changes and the crystallization behavior were investigated as a function of oxygen content and laser intensity. A decrease of the melting threshold by a factor of two with increasing oxygen content ͑0-44 at. %͒ was observed for the SiO x samples. Above the respective melting thresholds, not only a deterioration of the structural properties but also indications of a segregation of Si crystallites were found. Raman spectroscopy and transmission electron microscopy gave evidence for the existence of Si crystallites up to oxygen contents of 40 at. %. The crystal size reached an optimum for oxygen concentrations between 10 and 30 at. %.