“…CsPbBr 3 films with various concentrations of DEABr (0, 9, 11, and 13 mg/mL) were fabricated by one-step spin-coating on EA-PEDOT:PSS, and crystal structural analysis was performed by X-ray diffraction (XRD), as illustrated in Figure a. The diffraction peaks at 15.2, 21.5, 30.7, 34.3, and 37.7° can be assigned to the (100), (110), (200), (201), and (211) planes of the orthorhombic ( Pnma ) CsPbBr 3 crystal, consistent with previous reports. , According to the information on the peak positions and intensity ratios of each diffraction peak in the comparison chart, it is found that all perovskite films show almost the same XRD patterns, indicating that the crystal structure and growth orientation of CsPbBr 3 are not significantly affected by the added DEABr. To further investigate the effect of DEABr on the surface morphology of the perovskite film, surface morphologies of DEABr-CsPbBr 3 films with different concentrations were compared by overhead scanning electron microscopy (SEM).…”