2016
DOI: 10.1166/sam.2016.2687
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Phonon Scattering Effects in Drain-Current Model of Carbon Nanotube and Silicon Nanowire Field-Effect Transistors

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Cited by 4 publications
(2 citation statements)
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“…We have selected other published works on low-dimensional FETs to fairly assess the device performance of the proposed AlSi 3 FET. The selected published models include co-decorated SiNR FET [ 21 ], 27-ASiNR FET [ 20 ], Si nanowire (SiNW) FET [ 34 ], Si thin sheet FET [ 35 ], carbon nanotube (CNT) FET [ 36 ], graphene nanoribbon (GNR) FET [ 37 ], black phosphorene (BP) FET [ 38 ], and monolayer molybdenum disulfide (MoS 2 ) FET [ 39 ]. To concisely compare the device performance metrics, the comparisons are presented as bar graphs as shown in Fig 6 .…”
Section: Performances Analysis and Discussionmentioning
confidence: 99%
“…We have selected other published works on low-dimensional FETs to fairly assess the device performance of the proposed AlSi 3 FET. The selected published models include co-decorated SiNR FET [ 21 ], 27-ASiNR FET [ 20 ], Si nanowire (SiNW) FET [ 34 ], Si thin sheet FET [ 35 ], carbon nanotube (CNT) FET [ 36 ], graphene nanoribbon (GNR) FET [ 37 ], black phosphorene (BP) FET [ 38 ], and monolayer molybdenum disulfide (MoS 2 ) FET [ 39 ]. To concisely compare the device performance metrics, the comparisons are presented as bar graphs as shown in Fig 6 .…”
Section: Performances Analysis and Discussionmentioning
confidence: 99%
“…However, the scaling of silicon (Si) complementary metal-oxide-semiconductor (CMOS) technology is expected to face its fundamental limit as it enters the sub-10 nm scaling regime [2,3]. To leverage these shortcomings, various innovations involving feld-efect transistors (FETs), such as the tunnelling FETs (TFETs) [4], nanowire FETs (NWFETs) [5], multibridge-channel FETs (MBCFETs) [6], and two-dimensional (2D) FETs, have been actively developed and studied. Interestingly, 2D material-based FETs have been listed as the potential candidates for further transistor miniaturisation in the International Roadmap for Devices and Systems (IRDS) [7].…”
Section: Introductionmentioning
confidence: 99%