2019
DOI: 10.1088/1361-648x/ab169c
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Phase transformations in Pt/Fe bilayers during post annealing probed by resistometry

Abstract: X-ray diffraction (XRD), secondary neutral mass spectrometry (SNMS) depth profiling, and electrical resistivity measurements were used to follow the phase transformations in Pt/Fe bi-layered thin films during annealing. Initially, the electrical resistivity increases linearly with temperature up to 150 °C due to the contribution of phonon scattering of the metallic Pt and Fe bilayer. Further increase of the annealing temperature leads to a steeper linear increase, which is associated with the initial formation… Show more

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Cited by 2 publications
(1 citation statement)
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“…Post deposition treatments of the FCC phase are required to obtain the L1 0 ordered FCT phase. Moreover, structural and magnetic properties of L1 0 ordered FePt sensitively depend on the relative concentration of Fe and Pt, approaches of synthesis, post-deposition treatments, film structure in an as-deposited state, etc [6][7][8][9][10][11]. Therefore, wide research interest is directed at the optimization of structural and magnetic properties of FePt by synthesizing FePt films in diverse structures via various synthesis routes [12][13][14].…”
Section: Introductionmentioning
confidence: 99%
“…Post deposition treatments of the FCC phase are required to obtain the L1 0 ordered FCT phase. Moreover, structural and magnetic properties of L1 0 ordered FePt sensitively depend on the relative concentration of Fe and Pt, approaches of synthesis, post-deposition treatments, film structure in an as-deposited state, etc [6][7][8][9][10][11]. Therefore, wide research interest is directed at the optimization of structural and magnetic properties of FePt by synthesizing FePt films in diverse structures via various synthesis routes [12][13][14].…”
Section: Introductionmentioning
confidence: 99%