“…However, photoreflectance (PR), known as a powerful contactless spectroscopy technique, can reveal various features in semiconductor structures, particularly interface and surface characteristics [20]. This valuable information includes optical transitions [21], builtin electric fields [22], defect densities [23], strain influence [24], quantum efficiency [25], and more. Several works have also investigated the dynamics of carriers in structures such as photodiodes by employing a similar experimental setup and observing the transient behavior of reflectivity [26][27][28].…”