Phase-noise characterization of optoelectronic components by carrier suppression techniques

Shieh, William; Yao, X. Steve; Maleki, Lute; Lutes, G.

doi:10.1109/ofc.1998.657382

Cited by 10 publications

(6 citation statements)

References 1 publication

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“…The measurement of these 1 / f fluctuations is a challenging problem and has been reported previously only in a single instance. 30 A second source of noise is the EOM. While the physical structure makes one think that these components are less noisy than the active devices, no information has been found about their noise.…”

Section: Other Sources Of Noisementioning

confidence: 99%

Photonic-delay technique for phase-noise measurement of microwave oscillators

Rubiola¹,

Salik²,

Huang³

et al. 2005

J. Opt. Soc. Am. B

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A photonic-delay line is used as a frequency discriminator for measurement of the phase noise-hence the short-term frequency stability-of microwave oscillators. The scheme is suitable for electronic and photonic oscillators, including the optoelectronic oscillator, mode lock lasers, and other types of rf and microwave pulsed optical sources. The approach is inherently suitable for a wide range of frequency without reconfiguration, which is important for the measurement of tunable oscillators. It is also insensitive to a moderate frequency drift without the need for phase locking.

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Section: Other Sources Of Noisementioning

confidence: 99%

Photonic-delay technique for phase-noise measurement of microwave oscillators

Rubiola¹,

Salik²,

Huang³

et al. 2005

J. Opt. Soc. Am. B

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“…Many high performance systems such as those mentioned above could be limited by the close-in noise of the photodetector. Yet the lack of information regarding this topic-only one conference article [SYML98] is found in the literature-made this work necessary. In this paper we describe a sensitive measurement technique for the close-in phase noise and amplitude noise, and the measurement of several photodetectors used to detect microwave (10 GHz) sidebands of optical carriers.…”

Section: Introductionmentioning

confidence: 99%

Flicker noise in high-speed p-i-n photodiodes

Rubiola

Salik

et al. 2006

IEEE Trans. Microwave Theory Techn.

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The microwave signal at the output of a photodiode that detects a modulated optical beam contains the phase noise ϕ(t) and the amplitude noise α(t) of the detector. Beside the white noise, which is well understood, the spectral densities Sϕ(f ) and Sα(f ) show flicker noise, proportional to 1/f . We report on the measurement of the phase and amplitude noise of high-speed p-i-n photodiodes. The main result is that the flicker coefficient of the samples is ∼ 10 −12 rad 2 /Hz (−120 dBrad 2 /Hz) for phase noise, and ∼ 10 −12 Hz −1 (−120 dB) for amplitude noise. These values could be observed only after solving a number of experimental problems and in a protected environment. By contrast, in ordinary conditions insufficient EMI isolation, and also insufficient mechanical isolation, are responsible for additional noise to be taken in. This suggests that if package and EMC are revisited, applications can take the full benefit from the surprisingly low noise of the p-i-n photodiodes.

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“…The 1/f noise of the microwave photodetector is expected to be similar to that of an amplifier because the underlying physics and technology are similar. The measurement is a challenging experimental problem, which has been tackled only at the JPL independently by Rubiola and Shieh [33,32,27]. The results agree in that at 10 GHz the typical b −1 of a InGaAs p-i-n photodetector is of 10 −12 rad 2 /Hz (−120 dBrad 2 /Hz).…”

Section: Flicker Noisementioning

confidence: 86%

Applications of the optical fiber to the generation and measurement of low-phase-noise microwave signals

et al. 2008

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The optical fiber used as a microwave delay line exhibits high stability and low noise and makes accessible a long delay ( 100 µs) in a wide bandwidth (≈ 40 GHz, limited by the optronic components). Hence, it finds applications as the frequency reference in microwave oscillators and as the reference discriminator for the measurement of phase noise. The fiber is suitable to measure the oscillator stability with a sensitivity of parts in 10 −12 . Enhanced sensitivity is obtained with two independent delay lines, after correlating and averaging. Short-term stability of parts in 10 −12 is achieved inserting the delay line in an oscillator. The frequency can be set in steps multiple of the inverse delay, which is in the 10-100 kHz region.This article adds to the available references a considerable amount of engineering and practical knowledge, the understanding of 1/f noise, calibration, the analysis of the cross-spectrum technique to reduce the instrument background, the phase-noise model of the oscillator, and the experimental test of the oscillator model. * K. V. is also with the St.

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Phase-noise characterization of optoelectronic components by carrier suppression techniques

Cited by 10 publications

References 1 publication

Photonic-delay technique for phase-noise measurement of microwave oscillators

Photonic-delay technique for phase-noise measurement of microwave oscillators

Flicker noise in high-speed p-i-n photodiodes

Applications of the optical fiber to the generation and measurement of low-phase-noise microwave signals

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