1997
DOI: 10.1007/bf02684247
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Phase equilibria in the erbium-silicon system

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Cited by 10 publications
(4 citation statements)
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“…The figure shows the reflected x-ray intensity as a function of the double angle of incidence. Theoretical diffraction patterns for erbium mono-and disilicide are based on the crystallographic data from [4,5] and from [6] devoted to the erbium -silicon phase diagram. The PowderCell software tool was used to analyze silicide diffraction patterns, compare them with experimental patterns, and identify phases.…”
Section: Characteristic Of Specimensmentioning
confidence: 99%
“…The figure shows the reflected x-ray intensity as a function of the double angle of incidence. Theoretical diffraction patterns for erbium mono-and disilicide are based on the crystallographic data from [4,5] and from [6] devoted to the erbium -silicon phase diagram. The PowderCell software tool was used to analyze silicide diffraction patterns, compare them with experimental patterns, and identify phases.…”
Section: Characteristic Of Specimensmentioning
confidence: 99%
“…Only a limited amount of well-established experimented data exist for the R 5 (Si x Ge 1-x ) 4 phases for R = Pr, Ho, Er, Tm, and Y; these includes phase diagrams, and magnetic, electronic, and thermodynamic properties. [46][47][48][49][50][51][52][53][54][55][56][57].…”
Section: Previous Work On R 5 (Si X Ge 1-x ) 4 Where R Is Rare Eartmentioning
confidence: 99%
“…4 , and Y 5 (Si x Ge 1-x ) 4 Only a limited amount of well-established experimented data exist for the R 5 (Si x Ge 1-x ) 4 phases for R = Pr, Ho, Er, Tm, and Y; these includes phase diagrams, and magnetic, electronic, and thermodynamic properties. [46][47][48][49][50][51][52][53][54][55][56][57].…”
Section: Previous Work On R 5 (Si X Gementioning
confidence: 99%