1970
DOI: 10.1149/1.2407335
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Phase Diagram of the CdTe-CdSe Pseudobinary System

Abstract: The liquidus and solidus curves of the CdTe-CdSe pseudobinary system have been determined by thermal analysis of cooling and heating curves, respectively, for homogenized liquid and solid alloy samples. The phase diagram has a eutectie point at 1091 ~ • 1~ near 20 m/o (mole per cent) CdSe. Above the eutectic composition both liquidus and solidus temperatures increase monotonically and sublinearly with increasing CdSe content. In this region the experimental values of the liquidus-solidus gap do not exceed iI m… Show more

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Cited by 84 publications
(28 citation statements)
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“…The experimental data are taken from Steininger et al [18]. This type of x versus T variation suggests small and nearly comparable positive deviations from ideality in the solid and liquid phases and is similar to those observed in other II-VI systems, such as ZnSe-ZnTe [19], CdSe-CdTe [20] and HgSe-HgTe (Figure 2.9). The solidus and liquidus curves in Figure 2.6 represent monotonic and sublinear variations with x from the melting point of CdTe to that of ZnTe.…”
Section: (B) Iii-v Semiconductor Alloysupporting
confidence: 71%
“…The experimental data are taken from Steininger et al [18]. This type of x versus T variation suggests small and nearly comparable positive deviations from ideality in the solid and liquid phases and is similar to those observed in other II-VI systems, such as ZnSe-ZnTe [19], CdSe-CdTe [20] and HgSe-HgTe (Figure 2.9). The solidus and liquidus curves in Figure 2.6 represent monotonic and sublinear variations with x from the melting point of CdTe to that of ZnTe.…”
Section: (B) Iii-v Semiconductor Alloysupporting
confidence: 71%
“…where I hkl is the intensity of a refl ection from the {hkl} family of planes, I r,hkl is the relative intensity of this family of planes for a powder sample, and n p is the number of refl ections present in the diffractogram (note that the I r,hkl values used here were averages of XRD data for CdTe powder from six entries to the ICSD database [32][33][34][35][36][37] and the spread in the relative intensities reported by these studies was less than 4% for all refl ections). Then, the standard deviation, σ , of these texture coeffi cients as given by [ 30 ] 1/ 1…”
Section: Microstructural Properties Of Treated Cdte Devicesmentioning
confidence: 99%
“…is known to form solid solutions, namely the lattice parameters vary linearly with composition according to Vegard's law, without causing a structural phase transformation (no transformation to a different crystal structure) in the region x < 0.5.12. 13 Perfect lattice match (zero mismatch) in epitaxial growth of Cd(Se 1_ xTex) on Au (in the {111}Aull{00.1}cd(se. Te) ; (110)Aull(11.0)Cd(Se.…”
Section: Plan-view Tem Bf Images Of Ods Electrodeposited Onmentioning
confidence: 99%
“…or by temperature variation.'? Lattice matching in the epitaxial growth of CdSI_ySeyon {111} InP was achieved for y =0.08,11 Studies of homogeneous alloys of hexagonal CdSel_xTe x showed a behavior conforming to Vegard's law (i.e., the lattice parameters vary linearly with composition) for 0 < x < 0.3, with different slopes for a o and for C O • 12,13 The phase diagram of the CdSe l_x Te, binary system indicated a wurtzite structure for alloys with x < 0.5 and a zinc-blende structure when x > 0.5, with a narrrow two-phase region when x ... 0.5.J3Raman spectroscopy of Cd(Se,Te) single-crystals indicated a two-mode behavior, namely the presence of CdSe-like and CdTe-like optical phonons in the Raman spectrum.lv"…”
mentioning
confidence: 99%