2015
DOI: 10.1093/jmicro/dfv011
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Phase-contrast scanning transmission electron microscopy

Abstract: This report introduces the first results obtained using phase-contrast scanning transmission electron microscopy (P-STEM). A carbon-film phase plate (PP) with a small center hole is placed in the condenser aperture plane so that a phase shift is introduced in the incident electron waves except those passing through the center hole. A cosine-type phase-contrast transfer function emerges when the phase-shifted scattered waves interfere with the non-phase-shifted unscattered waves, which passed through the center… Show more

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Cited by 17 publications
(10 citation statements)
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“…This achieves super-resolution three-dimensional reconstruction without electron staining in FIB/ SEM technology. Moreover, combining super-resolution CL imaging with recently developed phase contrast scanning transmission electron imaging using an environmental cell 20,21 opens up the possibility of simultaneous observation of light and electron images with extreme spatial resolution without chemical staining.…”
Section: Resultsmentioning
confidence: 99%
“…This achieves super-resolution three-dimensional reconstruction without electron staining in FIB/ SEM technology. Moreover, combining super-resolution CL imaging with recently developed phase contrast scanning transmission electron imaging using an environmental cell 20,21 opens up the possibility of simultaneous observation of light and electron images with extreme spatial resolution without chemical staining.…”
Section: Resultsmentioning
confidence: 99%
“…Although ptychography 4D-STEM under zero defocus offers an phase image that can be combined with simultaneous Z-contrast imaging, its sine-shaped contrast transfer function at low spatial frequencies [26] remains to be improved. Recently, it has been shown that introducing a phase plate at the probe forming aperture of a STEM, which is equivalent to a Zernike phase plate in the back focal plane of a TEM [27] based on the principle of reciprocity [28], leads to a phase contrast transfer function (PCTF) that depends on the cosine of the aberration wave shift [29]. Another study demonstrated that the introduction of a patterned pre-specimen phase plate in the probe forming aperture combined with a virtual detector whose geometry matches that of the phase plate, a method called matched illumination detector interferometry (MIDI-STEM) [30], gives a linear phase image with enhanced contrast transfer of low spatial frequency specimen information.…”
Section: Introductionmentioning
confidence: 99%
“…That's because the sine type PCTF of the conventional STEM is almost zero at low spatial frequency and image contrast of such samples can't be obtained. Our previous STEM study shows the validity of the ZPP to visualize nm scale materials [1,2].…”
mentioning
confidence: 98%