Phase and microstructural analysis of NdTi0.8M0.2O3.4 (M = Al, Ga) microwave ceramics

Abstract

In this paper, we report the characterization of NdTi0.8M0.2O3.4 (M = Ga, Al) ceramics prepared via mixed oxide solid state sintering route. X-ray diffraction analysis of the samples revealed the formation of single phase for NdTi 0.8 Ga 0.2 O 3.4 sample while secondary phase was formed in the case of NdTi 0.8 Al 0.2 O 3.4. Microstructural analysis of the sample showed dense packed grains. NdTi0.8M0.2O3.4 with M = Ga and Al exhibited a dielectric constant (r) = 34, quality factor (Q×f) = 9,776 and 10,867 GHz and temperature coefficient of resonance frequency (τf) =-113 and-90 ppm/ o C, respectively. Further work is required on tuning the low τf of the samples for possible applications in the GHz frequency range.