Permittivity Measurement With a Non-Standard Waveguide by Using TRL Calibration and Fractional Linear Data

Challa, R. K.; Kajfez, D.; Gladden, Joseph R.; Elsherbeni, Atef Z.; Demir, Veysel

doi:10.2528/pierb07102001

Cited by 40 publications

(37 citation statements)

References 11 publications

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“…1. If the cell was a reflecting, non-standard or non-uniform cell [20,21], we would attain the same result in (17) since the difference between the two configurations in Fig. 1 is the presence of the sample [11].…”

Section: A Metric Function For Evaluation Of the Reciprocitysupporting

confidence: 52%

A Simple Approach for Evaluating the Reciprocity of Materials Without Using Any Calibration Standard

Hasar¹,

Şimşek²

2009

PIER

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Abstract-A simple approach for evaluation of the reciprocity of materials using raw scattering parameter measurements is proposed. This approach not only reduces the overall measurement time but also eliminates the need for calibrating the measurement system since it uses calibration-independent measurements. We have derived a metric function for reflecting and nonreflecting cells, which are used to house the sample under test. This function does not depend on electrical properties of materials and their lengths, and whether the cell is reflecting. We have also investigated the effects of the sample length and air pockets between sample external surfaces and cell inner walls on the performance of the evaluation of sample reciprocity.

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Section: A Metric Function For Evaluation Of the Reciprocitysupporting

confidence: 52%

A Simple Approach for Evaluating the Reciprocity of Materials Without Using Any Calibration Standard

Hasar¹,

Şimşek²

2009

PIER

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“…The key factor for determining the explicit expression for L in (17) comes from that the sample thickness is a physical parameter (not changing with f ). It is also evident that, using (14), (15), and (17) one can find L in terms of χ (1) max , f (1) max , and f (1) min (or f (2) max ).…”

Section: Closed-form Expressions For Determination Of Thickness and Amentioning

confidence: 99%

Microwave Method for Thickness-Independent Permittivity Extraction of Low-Loss Dielectric Materials From Transmission Measurements

Hasar¹

2010

PIER

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Abstract-A non-resonant microwave method has been proposed for complex permittivity determination of low-loss materials with no prior information of sample thickness. The method uses two measurement data of maximum/minimum value of the magnitude of transmission properties of the sample to determine an initial guess for permittivity and find the sample thickness. An explicit expression for sample thickness and two expressions for inversion of the complex permittivity of the sample are derived. The method has been validated by transmission measurements at X-band (8.2-12.4 GHz) of a low-loss sample located into a waveguide sample holder.

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“…Pulse propagation in inhomogeneously filled guides has received far less attention [9,10], even though partially-filled guides are often used for determining the constitutive parameters of material samples [11][12][13][14][15]. Recently, Moradi and Abtipour [16] proposed using time-domain methods to extract the material parameters of waveguide samples.…”

Section: Introductionmentioning

confidence: 99%

Pulse Reflection From a Dielectric Discontinuity in a Rectangular Waveguide

Rothwell¹,

Temme²,

Crowgey³

2009

PIER

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Abstract-A simple, closed-form expression for the time-domain reflection coefficient for a pulsed TE 10 -mode wave incident on a dielectric material discontinuity in a rectangular waveguide is presented. This formula may be used to represent the transient field reflected or transmitted by a dielectric-filled waveguide section, which is useful in material characterization routines. An exponential function approximation to the reflection coefficient is presented, and the formula is validated both numerically and experimentally.

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Permittivity Measurement With a Non-Standard Waveguide by Using TRL Calibration and Fractional Linear Data

Cited by 40 publications

References 11 publications

A Simple Approach for Evaluating the Reciprocity of Materials Without Using Any Calibration Standard

A Simple Approach for Evaluating the Reciprocity of Materials Without Using Any Calibration Standard

Microwave Method for Thickness-Independent Permittivity Extraction of Low-Loss Dielectric Materials From Transmission Measurements

Pulse Reflection From a Dielectric Discontinuity in a Rectangular Waveguide

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