2008
DOI: 10.1163/156939308784150272
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Permittivity Measurement of Ferroelectric Thin Film Based on CPW Transmission Line

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Cited by 14 publications
(10 citation statements)
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“…The N th layer is unbounded in the zdirection (Region N is an infinite dielectric half space). The incident and reflected magnetic fields inside the parallel-plate waveguide are given respectively as (2) where …”
Section: Termination By An Infinite Half Spacementioning
confidence: 99%
See 1 more Smart Citation
“…The N th layer is unbounded in the zdirection (Region N is an infinite dielectric half space). The incident and reflected magnetic fields inside the parallel-plate waveguide are given respectively as (2) where …”
Section: Termination By An Infinite Half Spacementioning
confidence: 99%
“…Knowing these properties precisely enables scientists and engineers to use the appropriate materials for intended applications, such as the design of ferroelectrics [1,2], ceramics [3] and so forth. Understanding how dielectric material properties vary at frequencies above 1 GHz is especially important and challenging in the new areas of interest such as propagation modelling in wireless communications [4,5], aerospace ice-detection [6], radar detection of buried objects which is influenced by soil characteristics [7][8][9][10], and biomedical systems such as in the detection of cancer [11][12][13][14][15][16], and diagnosis of the functional conditions of biological tissues [17,18], where accurate data of dielectric properties is critically required.…”
Section: Introductionmentioning
confidence: 99%
“…With increasing utilization of different materials, including composite materials, there is a growing industrial demand for dielectric characterization of these materials for design, manufacturing, and quality control purposes in industries such as civil, aerospace, electronics, chemical, etc. [1][2][3][4][5][6][7][8]. Many factors such as the frequency range, required measurement accuracy, sample size, state of the material (liquid, solid, powder and so forth), destructiveness and non-destructiveness, contacting and non-contacting, etc.…”
Section: Introductionmentioning
confidence: 99%
“…However, this system presents several drawbacks in the case of solid materials with low losses, such as some kind of marbles [3][4][5][6][7][8][9][10]. The measurement is indeed sensitive to the MUT surface roughness and the presence of local defects, such as voids or grains, has a strong influence on the measurement accuracy.…”
Section: Introductionmentioning
confidence: 99%