X-ray lithography (XRL) is a patterning technique for the fabrication
of semiconductor devices with very small dimensions (⩽100 nm).
In this process the device and circuit layout images are formed by
exposing a thin layer of organic material, the photoresist. XRL is
based on the idea that the short wavelength (≈1 nm) of the
radiation allows a faithful reproduction of the desired pattern to very
small dimensions. The physics of the interaction of the x-rays with
matter dictates many aspects of the technique: the imaging process
is controlled by Fresnel diffraction, and the recording process by
the interaction of low-energy photoelectrons with the resist material.
Phase shift effects play a key role in the image formation process,
and are used to improve the sharpness of the image. To achieve
high-resolution patterning it is necessary to carefully design the pattern
itself, and optimize several exposure parameters. This paper presents
a detailed discussion of the image formation process, and a brief
review of other technical aspects of the technology.