Performance of a low-noise CCD camera adapted to a transmission electron microscope

Kujawa, Stephan; Krahl, D.

doi:10.1016/0304-3991(92)90026-g

Cited by 60 publications

(13 citation statements)

References 2 publications

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“…No binning on the CCD or on the captured EBSPs was performed; the recorded EBSPs have a dimension of 936 Â 936 pixels with 12 bit depth per pixel. For the purpose of illustration, the EBSPs depicted throughout this article are divided by a flat-field image obtained by scanning the beam over a large area composed of many grains (Baba-Kishi, 2002;Goehner & Michael, 1996;Kujawa & Krahl, 1992). However, the EBSPs used for computation are as captured by the camera without any postprocessing.…”

Section: Methodsmentioning

confidence: 99%

Kikuchi bandlet method for the accurate deconvolution and localization of Kikuchi bands in Kikuchi diffraction patterns

2014

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In order to retrieve crystallographic information from an electron backscatter Kikuchi diffraction pattern, its Kikuchi bands have to be localized. One of the main reasons for the limited precision of the present Kikuchi band localization methods is that the diffuse edges of a Kikuchi band are convoluted by many other Kikuchi bands that intersect them. To improve the localization accuracy, Kikuchi bands have to be deconvoluted. In this article, a new method for the deconvolution and localization of Kikuchi bands is presented. The deconvolution is based on the fact that, in a Kikuchi pattern, there are a number of Kikuchi bands that are not parallel to the bands that intersect them. It is performed in Fourier space. After deconvolution, localization is carried out by a quantitative shape analysis of the intensity profiles of the deconvoluted Kikuchi bands. Using the introduced method, for a real electron backscatter Kikuchi diffraction pattern with 45 half capture angle and 0.12 per pixel maximum scale factor, the characteristic hyperbolic features of the Kikuchi bands can be localized with a precision of better than 0.1 in reflection angle.

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Section: Methodsmentioning

confidence: 99%

Kikuchi bandlet method for the accurate deconvolution and localization of Kikuchi bands in Kikuchi diffraction patterns

2014

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“…A number of papers have been published on various characteristics of detectors. For the SSC camera, the YAG scintillator and fiberoptical coupling configuration has been measured and reported in several publications (Daberkow et al, 1991, Kujawa and Krahl, 1992, Ishizuka, 1993, Weickenmeier et al, 1995, Zuo, 1996. The performance of this type camera has also been reported for biological applications (Sherman et al, 1996).…”

Section: Introductionmentioning

confidence: 94%

“…For a long time, film was the only suitable choice for quality image recording in electron microscopy. This has changed recently with the development of the slow-scan CCD (SSC) camera , Krivanek et al, 1991, Daberkow et al, 1991, Kujawa and Krahl, 1992, Fan and Ellisman, 1993, and imaging plates (Sonoda et al, 1983, Mori et al, 1990, Ogura et al, 1994 for digital recording. Both the SSC camera and IP are highly linear and have a large dynamic range.…”

Section: Introductionmentioning

confidence: 99%

Electron detection characteristics of a slow-scan CCD camera, imaging plates and film, and electron image restoration

Zuo

2000

Microsc. Res. Tech.

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“…Figure 16 demonstrates the use of a CCD camera for recording a Si [110] electron diffraction pattern. Unfortunately, the image readout speed must be limited in order to reduce readout noise (Kujawa and Krahl 1992) so dynamic viewing at TV rates seems unlikely to be achieved unless image quality is sacrificed. A useful table comparing the major properties of the slow-scan CCD camera with those of the intensified TV camera and the photographic plate can be found in de Ruijter and Weiss (1992), and a comprehensive overview of CCD cameras, detection parameters and characterization methods has recently been published by de Ruijter (1995).…”

Section: Image Viewing Recording and Processingmentioning

confidence: 99%

The realization of atomic resolution with the electron microscope

Smith¹

1997

Rep. Prog. Phys.

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The high-resolution electron microscope has evolved into a sophisticated instrument that is capable of routinely providing quantitative structural information on the atomic scale. Applications of atomic-resolution imaging can now be found in many scientific fields, and its impact on the knowledge and understanding of atomistic processes has been profound. Better control over instrumental parameters, enhanced reliability of signal recording, and novel methods for imaging and data processing are areas of highly active, ongoing research. Agreement over reliability factors, serious discrepancies in absolute contrast levels, and inversion of crystal scattering are identified as unresolved issues requiring further attention.

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Performance of a low-noise CCD camera adapted to a transmission electron microscope

Cited by 60 publications

References 2 publications

Kikuchi bandlet method for the accurate deconvolution and localization of Kikuchi bands in Kikuchi diffraction patterns

Kikuchi bandlet method for the accurate deconvolution and localization of Kikuchi bands in Kikuchi diffraction patterns

Electron detection characteristics of a slow-scan CCD camera, imaging plates and film, and electron image restoration

The realization of atomic resolution with the electron microscope

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