Performance limitations of stochastic sensors

Lin, Jian; Milkovic, M.

doi:10.1109/mwscas.1992.271275

Cited by 8 publications

(2 citation statements)

References 6 publications

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“…The response of a stochastic sensor follows a Gaussian cumulative density function (CDF) around the metastable point [13] [14][15] [16]. This can be approximated as linear when the signal is much smaller than the noise, as shown in Figure 3(b).…”

Section: Transmission Circuitmentioning

confidence: 99%

Built-in current sensor for IDDQ test

Xue

Walker

Proceedings. 2004 IEEE International Workshop on Current and Defect Based Testing (IEEE Cat. No.04EX1004)

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A practical Built-in Current Sensor (BICS) design is described in this paper. This sensor system is able to monitor the IDDQ at a resolution level of 10 µA. This system can translate the current level into a digital signal, with scan chain readout. There is no system performance degradation for this sensor and its power dissipation is kept at a very low level. With the help of a self-calibration circuit, the sensor can maintain its accuracy and achieve a clock rate of over 1 GHz, for a measurement time of a few milliseconds.

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Section: Transmission Circuitmentioning

confidence: 99%

Built-in current sensor for IDDQ test

Xue

Walker

Proceedings. 2004 IEEE International Workshop on Current and Defect Based Testing (IEEE Cat. No.04EX1004)

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“…The response of a stochastic sensor follows a Gaussian cumulative density function (CDF) around the metastable point [20] [21]. This can be approximated as linear when the signal is much smaller than the noise, as shown in Figure 4.…”

Section: Flip-flop Stochastic Sensormentioning

confidence: 99%

I/sub DDQ? test using built-in current sensing of supply line voltage drop

Xue

Walker

IEEE International Conference on Test, 2005.

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A practical built-in current sensor (BICS) is described that senses the voltage drop on supply lines caused by quiescent current leakage. This non-invasive procedure avoids any performance degradation. The sensor performs analog-to-digital conversion of the input signal using a stochastic process, with scan chain readout. Self-calibration and digital chopping are used to minimize offset and low frequency noise and drift. The measurement results of a 350 nm test chip are described. The sensor achieves a resolution of 182 µA, with the promise of much higher resolution.

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Stochastic magnetic field micro-sensor

Hentschke

Rohrer²,

Reifschneider³

Proceedings Ninth Annual IEEE International ASIC Conference and Exhibit

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Performance limitations of stochastic sensors

Cited by 8 publications

References 6 publications

Built-in current sensor for IDDQ test

Built-in current sensor for IDDQ test

I/sub DDQ? test using built-in current sensing of supply line voltage drop

Stochastic magnetic field micro-sensor

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