2017
DOI: 10.1049/iet-opt.2016.0141
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Performance enhancement of AlGaN/InGaN MQW LED with GaN/InGaN superlattice structure

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Cited by 9 publications
(8 citation statements)
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References 27 publications
(32 reference statements)
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“…The comparison of luminous and external quantum efficiencies of our simulated SQW SiC LED has been done with the similar structure of GaN MQW LED reported in the literature. Despite the presence of SQW, our device exhibited impressive luminous and external quantum efficiencies compared to that of the MQW LED device reported in the literature [50]. The comparison of the results has been tabulated in Tables 4 and 5.…”
Section: Calculations For Luminous Efficiency and External Quantum Ef...mentioning
confidence: 71%
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“…The comparison of luminous and external quantum efficiencies of our simulated SQW SiC LED has been done with the similar structure of GaN MQW LED reported in the literature. Despite the presence of SQW, our device exhibited impressive luminous and external quantum efficiencies compared to that of the MQW LED device reported in the literature [50]. The comparison of the results has been tabulated in Tables 4 and 5.…”
Section: Calculations For Luminous Efficiency and External Quantum Ef...mentioning
confidence: 71%
“…We could not find any similar edge LED structure in the literature MQWs increase current spreading and charge carriers' confinement. Ionization of electrons at high bias voltages increases the possibility of recombination of charge carriers [50]. However, we only introduced a SQW to reduce the complexity in fabrication and cost of the device.…”
Section: Power Spectral Density Of Simulated Sic Ledmentioning
confidence: 99%
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“…In consideration of the actual situation in the active region, the Shockley-Read-Hall (SRH) lifetime and the Auger recombination coefficient are set to be 10 ns and 1.0 Â 10 À31 cm 6 s À1 , respectively. [32,33] The electron and hole mobility of AlGaN are 250 and 5 cm 2 V À1 s À1 , while those of GaN are 300 and 10 cm 2 V À1 s À1 . [34] The energy band offset ratio ΔEc/ΔEv is 0.7/0.3 for III-nitride material systems.…”
Section: Introductionmentioning
confidence: 99%