2021
DOI: 10.1109/tte.2020.3009093
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Performance Degradation of Automotive Power MOSFETs Under Repetitive Avalanche Breakdown Test

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Cited by 4 publications
(1 citation statement)
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“…The superior di/dt and dv/dt controllability of the device can help achieving the expected tradeoff between turn-off losses and overshoot as well as electromagnetic interference (EMI) issues in application [20]. Otherwise, it could be difficult to meet the rigorous safety and reliability requirements in transportation systems [21], and to utilize the overall power handling capability of HV-IGBT modules due to the derated use [22]. Furthermore, optimizing the switching transient trajectories of power devices by adopting the active gate driver techniques also rely on the device-level controllability [23,24].…”
Section: Introductionmentioning
confidence: 99%
“…The superior di/dt and dv/dt controllability of the device can help achieving the expected tradeoff between turn-off losses and overshoot as well as electromagnetic interference (EMI) issues in application [20]. Otherwise, it could be difficult to meet the rigorous safety and reliability requirements in transportation systems [21], and to utilize the overall power handling capability of HV-IGBT modules due to the derated use [22]. Furthermore, optimizing the switching transient trajectories of power devices by adopting the active gate driver techniques also rely on the device-level controllability [23,24].…”
Section: Introductionmentioning
confidence: 99%