1977
DOI: 10.1002/pssa.2210420106
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Performance and analysis of recording microhardness tests

Abstract: With a microhardness arrangement which is constructed as an accessory equipment for modern material testing machines the generation of Vickers indentation is investigated by recording of the load during a programmed penetration of the pyramide. For all engineering materials investigated the relation between load L and penetration depth p could be fitted by L=a1p ± a2p2 with a high degree of statistical reliability. It is derived a new hardness number which is independent of the load also in the microhardness r… Show more

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Cited by 327 publications
(108 citation statements)
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“…The diagonals of the indentations d were measured for various loads P. Kick's law, P = ad2 [11] was verified for (100), (110) and (111) faces of NiO [8], CoO figure 3, together with results from the litterature.…”
mentioning
confidence: 80%
“…The diagonals of the indentations d were measured for various loads P. Kick's law, P = ad2 [11] was verified for (100), (110) and (111) faces of NiO [8], CoO figure 3, together with results from the litterature.…”
mentioning
confidence: 80%
“…However, the technique has also been fraught with potential artifacts, many of which are related to a phenomenon known as the "indentation size effect" [2][3][4][5][6][7][8][9][10][11]. This typically refers to the simple observation that the hardness measured by an indentation test is often not constant, but instead changes with applied load.…”
Section: Introductionmentioning
confidence: 99%
“…Its attractiveness stems largely from the fact that mechanical properties can be determined directly from indentation load and displacement measurements without the need to image the indentation impresssion. With high-resolution testing equipment, this facilitates the determination of properties at the micrometer and nanometre scales [9][10][11]. For this reason the method has become a primary technique for determining the mechanical properties of thin films without removing the film from the substrate and as well as for capturing small structural features [12][13][14][15][16][17][18][19][20][21][22][23][24][25][26][27][28][29].…”
Section: Introductionmentioning
confidence: 99%