2007 IEEE/ACS International Conference on Computer Systems and Applications 2007
DOI: 10.1109/aiccsa.2007.370875
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Performance Analysis of Reflection Paths for Millimeter Wavelength Systems

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Cited by 3 publications
(6 citation statements)
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“…1 (4) in which is the Fresnel dyadic reflection coefficient, a function of the unit vector at each point on the surface and the direction of incidence , as well as the complex dielectric constant of the surface. Expressions for the scalar Fresnel reflection coefficients for the field components that are parallel and perpendicular to the plane of incidence can be found in the literature [6].…”
Section: B Scattering Field Formulationmentioning
confidence: 99%
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“…1 (4) in which is the Fresnel dyadic reflection coefficient, a function of the unit vector at each point on the surface and the direction of incidence , as well as the complex dielectric constant of the surface. Expressions for the scalar Fresnel reflection coefficients for the field components that are parallel and perpendicular to the plane of incidence can be found in the literature [6].…”
Section: B Scattering Field Formulationmentioning
confidence: 99%
“…Expressions for the scalar Fresnel reflection coefficients for the field components that are parallel and perpendicular to the plane of incidence can be found in the literature [6]. The reflection coefficient for critical surfaces can be corrected by a surfaces roughness factor [4], [7], once the standard deviation of the elevation of the surface irregularities relative to its mean plane are obtained from high resolution data. In (3), signifies the unit vector in the direction of specular reflection of the surface mean plane due to incidence from the direction .…”
Section: B Scattering Field Formulationmentioning
confidence: 99%
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“…The reflection coefficient for critical surfaces can be multiplicatively corrected by a surface roughness factor [4], [8], once the standard deviation of the elevation of the surface irregularities relative to its mean plane are obtained from high resolution data. In (3), r ŝ signifies the unit vector in the direction of specular reflection of the surface mean plane due to incidence from the direction ' s .…”
Section: B Scattering Fieldsmentioning
confidence: 99%
“…The Kfactor can be mapped to the outage probability for a given modulation scheme, data rate, and transmitted power [4]. On the other hand, cross-polarized received power is fully characterized by the XPD of the link.…”
Section: Introductionmentioning
confidence: 99%