2021 IEEE 13th International Symposium on Diagnostics for Electrical Machines, Power Electronics and Drives (SDEMPED) 2021
DOI: 10.1109/sdemped51010.2021.9605493
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Performance Analysis and Reliability Investigation of a High Step-up DC-DC Converter

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Cited by 3 publications
(5 citation statements)
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“…The reliability analysis using the Markov approach involves calculating the reliability function, which is the probability that the system will remain in a specified state. Using MIL-HDBK-217F handbook and the equations in [28], the failure rates of the proposed inverter is derived, which is mentioned in TABLE I. According to the mentioned rates, the failure rates of active semiconductor devices in the proposed structure hold a higher total share in comparison with the passive components like inductors and capacitors.…”
Section: Reliability Assessmentmentioning
confidence: 99%
“…The reliability analysis using the Markov approach involves calculating the reliability function, which is the probability that the system will remain in a specified state. Using MIL-HDBK-217F handbook and the equations in [28], the failure rates of the proposed inverter is derived, which is mentioned in TABLE I. According to the mentioned rates, the failure rates of active semiconductor devices in the proposed structure hold a higher total share in comparison with the passive components like inductors and capacitors.…”
Section: Reliability Assessmentmentioning
confidence: 99%
“…Note that, the implemented method in this paper has been implemented to calculate the failure rate and analyze the reliability of the DC‐DC converters in several published articles. With respect to [56, 57], the temperature factor of different elements can be written as: αT(Switch)badbreak=exp()badbreak−1925()1Tj+2731298$$\begin{equation}{\alpha _T}(Switch) = \exp \left( { - 1925\left( {\frac{1}{{{T_j} + 273}} - \frac{1}{{298}}} \right)} \right)\end{equation}$$ αT(Diode)badbreak=exp()badbreak−3091()1Tj+2731298$$\begin{equation}{\alpha _T}(Diode) = exp\left( { - 3091\left( {\frac{1}{{{T_j} + 273}} - \frac{1}{{298}}} \right)} \right)\end{equation}$$ αTfalse(Inductorfalse)=exp0.118.617×1051THS+2731298$$\begin{eqnarray} {\alpha _T}(Inductor) = exp\left( {\frac{{ - 0.11}}{{8.617 \times {{10}^{ - 5}}}}\left( {\frac{1}{{{T_{HS}} + 273}} - \frac{1}{{298}}} \right)} \right)\nonumber\\[-3pt] \end{eqnarray}$$ αTfalse(Capacitorfalse)=exp0.118.617×1051THS+273…”
Section: Reliability Of the Proposed Grid‐tied Invertermentioning
confidence: 99%
“…The Markov strategy is the most well-known method for assessing the reliability of power systems. This method can be used if the system behaviour is determined based on memory shortage [56,57]. The Markov chain is described as a finite class of random processes {X n } with finite state space S if for any positive integers k, n (k ≤ n), and any choice of modes i 0 , …, i n+1 in S. Therefore, the Markov equation can be written as follows:…”
Section: Reliability Of the Proposed Grid-tied Invertermentioning
confidence: 99%
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