2020
DOI: 10.1134/s2075113320020227
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Peculiarities of Estimating the Optical Band Gap of Thin Films of Phase Change Memory Materials

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Cited by 8 publications
(8 citation statements)
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“…where ω is the incident laser radiation frequency, γ = e 0 /(m * µ) is the carrier collision frequency, e 0 and m * are the electron charge and effective mass, respectively, as well as µ = 52 cm 2 /(V•s) is the charge carrier mobility for GST225 [34]. The static dielectric permittivity of ε ∞ = 18.2 and ε ∞ = 44.2 correspond [27] to the non-excited amorphous and crystalline GST225, respectively. In this case, n e is the value of non-equilibrium charge carrier density, which can be estimated from the following differential equation:…”
Section: Theoretical Simulation Of Surface Photoexcitation and Lipss Formationmentioning
confidence: 99%
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“…where ω is the incident laser radiation frequency, γ = e 0 /(m * µ) is the carrier collision frequency, e 0 and m * are the electron charge and effective mass, respectively, as well as µ = 52 cm 2 /(V•s) is the charge carrier mobility for GST225 [34]. The static dielectric permittivity of ε ∞ = 18.2 and ε ∞ = 44.2 correspond [27] to the non-excited amorphous and crystalline GST225, respectively. In this case, n e is the value of non-equilibrium charge carrier density, which can be estimated from the following differential equation:…”
Section: Theoretical Simulation Of Surface Photoexcitation and Lipss Formationmentioning
confidence: 99%
“…where the absorption and reflection constants of the amorphous GST225 thin films for the wavelength of 1250 nm are taken as α = 24,500 cm −1 and R = 0.39 [27], respectively. Laser pulse intensity I(t) is defined as follows [35]:…”
Section: Theoretical Simulation Of Surface Photoexcitation and Lipss Formationmentioning
confidence: 99%
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“…For GST225 this value is varied in the range from 0.63 to 0.75 eV for amorphous state depending on the conditions of thin films preparation and the calculation algorithm; for crystalline state, the value is less and varies from 0.29 to 0.62 eV. [ 22 ] In this study, we analyze how a change in femtosecond laser wavelength affects the ripple parameters at constant parameters of thin films. The knowledge of specific features of LIPSS formation under various femtosecond light conditions allows one to shed light into the mechanism of fine surface structuring of PCMs.…”
Section: Introductionmentioning
confidence: 99%