2020
DOI: 10.1002/ange.202004211
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Peak Force Infrared–Kelvin Probe Force Microscopy

Abstract: Correlative scanning probe microscopy of chemical identity, surface potential, and mechanical properties provide insight into the structure–function relationships of nanomaterials. However, simultaneous measurement with comparable and high resolution is a challenge. We seamlessly integrated nanoscale photothermal infrared imaging with Coulomb force detection to form peak force infrared–Kelvin probe force microscopy (PFIR‐KPFM), which enables simultaneous nanomapping of infrared absorption, surface potential, a… Show more

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Cited by 12 publications
(17 citation statements)
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“…These results indicate that FcTc 2 can prevent surface ions from migration to produce a more uniform and stable surface component distribution (Fig. 2H) ( 25 ). By contrast, ion migration and volatilization were more prone to occur in the control films, resulting in increased surface defects and affecting the operational stability of perovskite devices (fig.…”
mentioning
confidence: 90%
“…These results indicate that FcTc 2 can prevent surface ions from migration to produce a more uniform and stable surface component distribution (Fig. 2H) ( 25 ). By contrast, ion migration and volatilization were more prone to occur in the control films, resulting in increased surface defects and affecting the operational stability of perovskite devices (fig.…”
mentioning
confidence: 90%
“…Mid-infrared (mid-IR) spectroscopy has attracted extensive attentions for interfacial studies since IR absorption of molecules arises from specific chemical bonds, allowing the analysis of molecular structures and functions without labelling or destruction. 1,2 Recently, atomic force microscopy (AFM) based opto-mechanical force detection techniques such as photothermal induced resonance (PTIR), [3][4][5][6] photoinduced force microscopy (PiFM) [7][8][9][10] and peak force infrared (PFIR) [11][12][13] microscopy have been demonstrated to achieve IR analysis with nanoscale spatial resolution, allowing subwavelength scale investigation of chemical and physical properties of molecules. At solid/gas interfaces, the detection sensitivity has hinted at molecular monolayer level, 3,7 which is promising to reveal information about the mechanisms of interfacial processes.…”
Section: Introductionmentioning
confidence: 99%
“…The integration of the FET-switched KPFM with PiFM provides a route for simultaneous and correlative surface potential and chemical nanoimaging. Compared with the recent pulsed force mode based peak force infrared-Kelvin probe force microscopy (PFIR-KPFM) that also simultaneous yield chemical and surface potential mapping, [58] the integrated FETswitched KPFM with PiFM has a simpler design of signal processing. The data collection and processing is achieved with a two-channel lock-in amplifier with a PID option in a commercially available device.…”
Section: Discussionmentioning
confidence: 99%