2014
DOI: 10.1088/0965-0393/22/5/055003
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Pattern formation in soft elastic films cast on periodically corrugated surfaces—a linear stability and finite element analysis

Abstract: Length scales of instabilities exhibited by soft, thin elastic films cast on smooth and sharp corrugated surfaces and in adhesive contact with an external contactor are investigated by means of linear stability analysis (LSA) and non-linear finite element analysis. The instability length scales are found to decrease with either an increase in the amplitude β or a decrease in the wavelength λp of the substrate pattern. For same substrate parameters, a step-patterned surface with higher RMS roughness is generall… Show more

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Cited by 10 publications
(8 citation statements)
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“…As β increases, the dominant length scale of instability decreases (as shown in the Figure 2), visible from the fact that the quarter ring in the inset shifts farther away from the origin. Thus, the dominant length 44 Figure 2A represents the results for the case of a a nearly flat substrate. Though the instability length scales decrease as the substrate pattern amplitudes β increase, there is no long-range order present in the patterns formed.…”
Section: ■ Results and Discussionmentioning
confidence: 99%
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“…As β increases, the dominant length scale of instability decreases (as shown in the Figure 2), visible from the fact that the quarter ring in the inset shifts farther away from the origin. Thus, the dominant length 44 Figure 2A represents the results for the case of a a nearly flat substrate. Though the instability length scales decrease as the substrate pattern amplitudes β increase, there is no long-range order present in the patterns formed.…”
Section: ■ Results and Discussionmentioning
confidence: 99%
“…It is reported in the prior works on elastic films cast on patterned substrates that the instability length scales are mainly influenced by the substrate pattern amplitude β p and are virtually independent of the substrate pattern wavelength λ p (except in some pockets of λ p ). 43,44 Hence, we assume a long-wave limit of the substrate patterning (i.e., k p → 0) for simplifying the stress-equilibrium equations of eqs A4−A6 in the computational plane. The stress equilibrium equations, thus, simplified are given in the Supporting Information.…”
Section: ■ Mathematical Modelingmentioning
confidence: 99%
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