1991
DOI: 10.1149/1.2085592
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Passivation of Surfaces within Aluminum Etch Tunnels

Abstract: Transient events accompanying passivation of active surfaces in aluminum etch tunnels are investigated. Passivation is induced by pulsed reductions of the anodic etching current, of several milliseconds duration. Scanning electron microscopy is used to measure the area passivated. Potential transients are analyzed to identify a possible potential driving force for passivation. For the experimental conditions of this work, at 0.13 ms after the current step, there is a temporary reduction in the metal dissolutio… Show more

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Cited by 27 publications
(42 citation statements)
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“…Measurements of the dissolved depth vs. time show that the rate of cathodic hydrogen evolution is significantly increased during the anodic pulse, by comparison with that at the more negative potentials during constant current etching. Good agreement of the present current-potential relation was obtained with that derived from the measurements of pit currents in thin films by Frankel et S0013-4651(00)02-012-7 CCC: $7.00 © The Electrochemical Society, Inc. drops inside and outside tunnels as well as concentration overpotentials in tunnels, taking advantage of previous measurements of the cell ohmic resistance, 19 as well as model predictions of the internal concentration and potential fields inside tunnels. 12,20 The interpretation of the electrochemical measurements is aided by microscopic observations of the topographic changes on the tip surfaces caused by the anodic current pulses.…”
supporting
confidence: 82%
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“…Measurements of the dissolved depth vs. time show that the rate of cathodic hydrogen evolution is significantly increased during the anodic pulse, by comparison with that at the more negative potentials during constant current etching. Good agreement of the present current-potential relation was obtained with that derived from the measurements of pit currents in thin films by Frankel et S0013-4651(00)02-012-7 CCC: $7.00 © The Electrochemical Society, Inc. drops inside and outside tunnels as well as concentration overpotentials in tunnels, taking advantage of previous measurements of the cell ohmic resistance, 19 as well as model predictions of the internal concentration and potential fields inside tunnels. 12,20 The interpretation of the electrochemical measurements is aided by microscopic observations of the topographic changes on the tip surfaces caused by the anodic current pulses.…”
supporting
confidence: 82%
“…This pretreatment enhances the number of tunnels formed during etching and the uniformity of their length distribution. 19 Etching was carried out under galvanostatic polarization, using a potentiostat/galvanostat (EG&G PAR 273), in 1 N HCl solution at a temperature of 65ЊC. During etching, aluminum samples were clamped into a glass holder which exposes 5.07 cm 2 of surface, and to which the platinum wire counter electrode was fixed.…”
Section: Methodsmentioning
confidence: 99%
“…The potential at the entrances of tunnels growing from the surface of such pits would be decreased by an amount equivalent to the pit's ohmic drop. Approximating the pit as a hemisphere, the ohmic drop can be roughly estimated as 3i sp r sp /, 4 where i sp and r sp are the surface pit current density and radius. Taking i sp ϭ 5 A/cm 2 , r sp ϭ 5 m, and ϭ 0.5 (⍀ cm͒ Ϫ1 , 4 a representative ohmic drop is found to be 15 mV, a value which according to Fig.…”
Section: Resultsmentioning
confidence: 99%
“…[4][5][6][7] In these experiments, the step or ramp causes the oxide film to cover part of the tunnel tip. In step experiments, passivation occurred in a time of order 1 ms, comparable to the characteristic time of potential decreases accompanying the step, but much smaller than the time for concentration changes to occur.…”
mentioning
confidence: 99%
“…The boundary condition far from the pit is the bulk concentration C6 C(r = , t) = C6 [5] while that at the hemisphere surface is given by the current density i(t) passing this surface = at) i(t)t 3FD [6] Since the dissolution current density, i, on the active surface inside the pit is always constant, the current density on the hemisphere, i(t), is found by multiplying i by the actively dissolving area in the pit and dividing by the hemisphere area…”
Section: Infroductionmentioning
confidence: 99%