2016 6th IEEE International Conference on Control System, Computing and Engineering (ICCSCE) 2016
DOI: 10.1109/iccsce.2016.7893630
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Particles contaminations detection during plasma etching process by using k-nearest neighbors and Fuzzy k-nearest neighbors

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Cited by 3 publications
(1 citation statement)
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“…It is also one of the simplest ways of classifying the data [13]. The kNN uses the database by depending on the value k and classifies the new data set by training it to detect the new data to the nearest neighbors and predict the data [14]. It provides an alternative solution to increasing the computational power of the linear machine.…”
Section: Introductionmentioning
confidence: 99%
“…It is also one of the simplest ways of classifying the data [13]. The kNN uses the database by depending on the value k and classifies the new data set by training it to detect the new data to the nearest neighbors and predict the data [14]. It provides an alternative solution to increasing the computational power of the linear machine.…”
Section: Introductionmentioning
confidence: 99%