2009
DOI: 10.1007/s10853-009-3457-0
|View full text |Cite
|
Sign up to set email alerts
|

Particle size-dependent electrical properties of nanocrystalline NiO

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

3
32
0

Year Published

2011
2011
2016
2016

Publication Types

Select...
8
1

Relationship

0
9

Authors

Journals

citations
Cited by 76 publications
(35 citation statements)
references
References 42 publications
3
32
0
Order By: Relevance
“…However, a small (0.16%) increase in the cell volume was observed for the sample S1 with L BET ≈ 13 nm. This result agrees with an increase of the lattice parameter in nanosized NiO, which has been found previously by x-ray diffraction [10,13] and x-ray absorption spectroscopy [14]. Note that while the widths of the structural and magnetic peaks are close in the sample S4, the broadening of the magnetic peaks occurs upon crystallites size reduction (Fig.…”
Section: Methodssupporting
confidence: 91%
“…However, a small (0.16%) increase in the cell volume was observed for the sample S1 with L BET ≈ 13 nm. This result agrees with an increase of the lattice parameter in nanosized NiO, which has been found previously by x-ray diffraction [10,13] and x-ray absorption spectroscopy [14]. Note that while the widths of the structural and magnetic peaks are close in the sample S4, the broadening of the magnetic peaks occurs upon crystallites size reduction (Fig.…”
Section: Methodssupporting
confidence: 91%
“…This fact is in agreement with the overall unit cell volume expansion upon a decrease of NiO nanocrystals size observed by diffraction. 59,60 On the contrary to the second shell behavior, the average first shell R(Ni-O 1 ) distance in all nanocrystalline samples is shorter compared with microcrystalline NiO (See Fig. 4).…”
Section: Resultsmentioning
confidence: 84%
“…Thus, we believe that our work may assist in understanding the full potential of CuO electrodes in p-type DSSCs. 17,18 Firstly, a new and comprehensive approach for the interpretation of EIS measurements, which was validated by a thorough comparison with different devices, is described. This is compared to already known models for EIS characterization of p-type DSSCs.…”
Section: Introductionmentioning
confidence: 99%