1998 IEEE MTT-S International Microwave Symposium Digest (Cat. No.98CH36192)
DOI: 10.1109/mwsym.1998.700640
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Partially prism-gridded FDTD analysis for layered structures of transversely curved boundary

Abstract: A partially prism-gridded FDTD analysis is presented to deal with layered structures with curved boundary in transverse directions. It is applied to calculate the scattering paxameters of vias in multilayer packaging. The good agreement of the results with those by other methods verifies the accuracy of this analysis.

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