2001
DOI: 10.1002/sia.1034
|View full text |Cite
|
Sign up to set email alerts
|

Partial reduction of Si(IV) in SiO2 thin film by deposited metal particles: an XPS study

Abstract: Metal-support interactions in systems of dispersed metals supported on thin-film silica surfaces were examined by x-ray photoelectron spectroscopy. Four metal-silica systems -Pt-, Pd-, Ag-and Au-SiO 2 -all indicated the formation of partially reduced Si(IV) species by the metal deposition. The extent of the reduction varied little with the kind or amount of deposited metal species. On the other hand, the amount of this newly formed Si(IV-d) indicated a strong metal species dependence.

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1

Citation Types

2
12
0

Year Published

2002
2002
2022
2022

Publication Types

Select...
8

Relationship

0
8

Authors

Journals

citations
Cited by 18 publications
(14 citation statements)
references
References 25 publications
(21 reference statements)
2
12
0
Order By: Relevance
“…Similar work function changes for Ni/TiO 2 , 25 Ag/MgO, 19 and Cu/ZnO 22 have been interpreted in terms of charge transfer from the metal to the oxides. Previous XPS studies have also indicated that charge transfer from Ag to SiO 2 takes place, 26 consistent with the present data. Also, recent theoretical calculations for the Cu/SiO 2 system have shown that metal clusters can become charge-deficient on a perfect SiO 2 surface, leading to electrostatic bonding between the metal cluster and two nearest-neighbor O atoms.…”
Section: Resultssupporting
confidence: 95%
“…Similar work function changes for Ni/TiO 2 , 25 Ag/MgO, 19 and Cu/ZnO 22 have been interpreted in terms of charge transfer from the metal to the oxides. Previous XPS studies have also indicated that charge transfer from Ag to SiO 2 takes place, 26 consistent with the present data. Also, recent theoretical calculations for the Cu/SiO 2 system have shown that metal clusters can become charge-deficient on a perfect SiO 2 surface, leading to electrostatic bonding between the metal cluster and two nearest-neighbor O atoms.…”
Section: Resultssupporting
confidence: 95%
“…The authors discuss the formation of covalent bonds between the silver nanoparticles and the defect centers of the SiO 2 film during their investigation by metastable pulse electronic spectroscopy and ultraviolet photoelectron spectroscopy. The silver clusters carry a positive charge as a result of electron transfer from the Ag to the SiO 2 with partial reduction of the Si(IV) [53]. The analogous situation for gold was discussed in [54].…”
Section: Introductionmentioning
confidence: 92%
“…6, and also expressed as equivalent H 2 consumption per Cu atom, assuming reduction of CuO. The reduction of the unpromoted Cu/SiO 2 catalyst is completed at 700 K when the H 2 /Cu ratio equals 1; the further weight loss at T red > 800 K may be attributed to either reduction or sintering of the silica support [26,27]. For high-loaded Al 2 O 3 supported systems it was reported that N 2 O passivation induced modification of the Cu particle structure, ascribed to the heat of dissociative adsorption [28]; a H 2 TPD method was suggested by these authors to selectively measure the Cu metal area.…”
Section: Thermogravimetrymentioning
confidence: 99%