2022
DOI: 10.1109/tpel.2021.3130209
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Parasitic Effect Compensation Method for IGBT ON-State Voltage Measurement in Traction Inverter Application

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Cited by 4 publications
(1 citation statement)
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“…Gridconnected inverters play an important role in electricity generation using various energy sources, so they have been widely used in the field of power generation [1][2][3][4][5][6], and their reliability is very important for stably and reliably merging the generated electricity in to the large power grid [7][8][9][10][11]. IGBT module is one of the most widely used power switching device in various power converters, and its reliability determines the reliability of grid-connected inverters [12][13][14][15][16]. According to existing research findings, temperature fluctuation during operation is the primary reason for gradual failure of IGBT module, and causes for such temperature fluctuation include the fundamental frequency junction temperature fluctuation caused by sinusoidal changes of network side current, and the low frequency junction temperature fluctuation caused by power fluctuation of system [17][18][19][20][21][22][23].…”
Section: Introductionmentioning
confidence: 99%
“…Gridconnected inverters play an important role in electricity generation using various energy sources, so they have been widely used in the field of power generation [1][2][3][4][5][6], and their reliability is very important for stably and reliably merging the generated electricity in to the large power grid [7][8][9][10][11]. IGBT module is one of the most widely used power switching device in various power converters, and its reliability determines the reliability of grid-connected inverters [12][13][14][15][16]. According to existing research findings, temperature fluctuation during operation is the primary reason for gradual failure of IGBT module, and causes for such temperature fluctuation include the fundamental frequency junction temperature fluctuation caused by sinusoidal changes of network side current, and the low frequency junction temperature fluctuation caused by power fluctuation of system [17][18][19][20][21][22][23].…”
Section: Introductionmentioning
confidence: 99%