2019
DOI: 10.1016/j.enbuild.2019.109426
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Parametric study of the method for determining the thermal diffusivity of building walls by measuring the temperature profile

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Cited by 3 publications
(1 citation statement)
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“…It has semiconductor temperature sensors Pt1000 at several depths as shown in Figure 1. Measurements were performed using the setup described in detail in [19][20][21]. The sensors are positioned with spacing c = 10 cm apart parallel to the wall.…”
Section: Methodsmentioning
confidence: 99%
“…It has semiconductor temperature sensors Pt1000 at several depths as shown in Figure 1. Measurements were performed using the setup described in detail in [19][20][21]. The sensors are positioned with spacing c = 10 cm apart parallel to the wall.…”
Section: Methodsmentioning
confidence: 99%