1997
DOI: 10.1093/oxfordjournals.rpd.a032184
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Parameters Influencing the Existence and the Observability of Etched Tracks: Application to Alpha Particle Detection in CR-39

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Cited by 15 publications
(3 citation statements)
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“…1) and clamped using a microscopic slide as bottom cover. Before assembly, the cover glass was treated in 7 wt % NaOH solution at 60 °C for 20 min to increase negative charge and pit densities of the substrate surfaces in order to have the crystals stick better to the surface of the glass coverslip. This treatment was necessary to prevent crystals from moving during atomic force microscopy scans. All components of the assembly were thoroughly rinsed in doubly distilled H 2 O with sonication for 5 min before use.…”
Section: Methodsmentioning
confidence: 99%
“…1) and clamped using a microscopic slide as bottom cover. Before assembly, the cover glass was treated in 7 wt % NaOH solution at 60 °C for 20 min to increase negative charge and pit densities of the substrate surfaces in order to have the crystals stick better to the surface of the glass coverslip. This treatment was necessary to prevent crystals from moving during atomic force microscopy scans. All components of the assembly were thoroughly rinsed in doubly distilled H 2 O with sonication for 5 min before use.…”
Section: Methodsmentioning
confidence: 99%
“…The group from the Universite de Franche-Comte (UFC) has created a comprehensive computer code to simulate the track's evolution under chemical etching, using an adjusted function for the track etch rate (Fromm et al, 1991(Fromm et al, , 1993(Fromm et al, , 1996Membrey et al, 1993;Meyer et al, 1997Meyer et al, , 1998. Such functions have a number of adjustable free parameters.…”
Section: Introductionmentioning
confidence: 99%
“…En effet, dans certains cas, lorsqu'une trace est inclinée, la gravure ne permet pas de la rendre observable en raison de l'attaque globale du matériau qui ronge la surface du détecteur plus rapidement que la trace elle-même en raison de son inclinaison. Cependant, comme la vitesse V T peut être croissante, la trace gravée peut apparaître après un certain temps : le temps différé (Meyer et al, 1997).…”
Section: Gravure Chimique Des Traces Nucléairesunclassified