2008
DOI: 10.1063/1.2937124
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p - Zn O ∕ n - Si heterojunction: Sol-gel fabrication, photoresponse properties, and transport mechanism

Abstract: p - Zn O ∕ n - Si heterojunction is achieved by depositing Al–N codoped p-type ZnO film on n-Si by low-cost sol-gel technique. The junction shows good diode characteristics with rectification ratio (IF∕IR)∼10 at 4V in the dark. The photoresponse of the heterojunction is investigated by studying the current-voltage characteristics under the ultraviolet (370nm) and visible light (450nm) illuminations. By fitting the experimental data, we have proposed the current transport mechanism to be dominated by the recomb… Show more

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Cited by 153 publications
(66 citation statements)
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“…The I-V curve of a p-n junction diode can typically be described by an equation,I ¼ I s exp qV=nkT ð ÞÀ1 ½ , where n is the ideality factor and I s is the reverse saturation current. 15,30,31 The obtained ideality factor for the region 0.01-0.4 V is n ¼ 3.1. This is lower than that previously reported for p-ZnO/n-Si heterojunction ($4), 13 and significantly lower than that previously reported a ZnO homojunction diode ($24).…”
Section: -4mentioning
confidence: 99%
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“…The I-V curve of a p-n junction diode can typically be described by an equation,I ¼ I s exp qV=nkT ð ÞÀ1 ½ , where n is the ideality factor and I s is the reverse saturation current. 15,30,31 The obtained ideality factor for the region 0.01-0.4 V is n ¼ 3.1. This is lower than that previously reported for p-ZnO/n-Si heterojunction ($4), 13 and significantly lower than that previously reported a ZnO homojunction diode ($24).…”
Section: -4mentioning
confidence: 99%
“…At higher bias voltages, dependence I $ V 2 attributed to the space charge limited current is typically observed. 13,15,32 However, fitting the I-V curve in the region 0.4-5 V with exponential function I ¼ a V m resulted in m ¼ 1.44. This is close to a value of m ¼ 1.5 which has been previously observed in different heterojunctions, 31,33,34 and which can occur in the case of double injection of carriers, 31 injection from a point contact, 33 and presence of a trap density gradient.…”
Section: -4mentioning
confidence: 99%
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“…(5), we give the dark current as a function of junction-voltage in forward bias. At forward voltage, the I-V characteristic was deviated from the ideal thermionic emission and behaved as I~V 2 relation, which was attributed to the space-charge limited current (SCLC) conduction [12][13][14][15]. This SCLC mechanism is a normal phenomenon in the wide band gap semiconductors due to single-carrier injection [14,15].…”
Section: Carrier Transport Mechanismmentioning
confidence: 99%