Abstract:Cu erosion of via hole within GOA unit of super‐large and ultra‐HD TFT‐LCD of 120Hz frame rate is an important issue and may cause some line failures. Reliability tests of panel about temperature and humidity are used to accelerate occurrences of the relative failures (Y‐Line). Effects of some critical factors including ITO thickness, tray life and sealant coverage are analyzed for optimal combination of mass production parameters. Furthermore, mechanisms of the Y‐Line failure are dissected by some modern anal… Show more
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