P‐134: Detection of Ion Impurities in Organic Thin Films by Displacement‐Current Measurement Method

Abstract

In this study, we have succeeded in detecting the amount of ions in the thin films of organic materials for OLED fabricated by vacuum deposition using the displacement current measurement (DCM). We could quantitatively evaluate the decrease of ionic impurities by the purification of organic materials. This method can be applied to the evaluation of the purity of organic materials for OLED.