1991
DOI: 10.1063/1.1142440
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Ozone jet generator as an oxidizing reagent source for preparation of superconducting oxide thin film

Abstract: An ozone jet generator to supply precisely controlled ozone flux to a specimen was constructed with the particular aim of its application for the preparation of superconducting oxide thin films by an MBE (molecular beam epitaxy) method. The ozone jet is supplied to the thin film growth chamber by evaporating the liquid (or solid) ozone accumulated in the ozone vessel of the generator. The necessary condensed ozone is produced from the ozone-oxygen mixture gas generated by a commercial ozonizer. The ozone flux … Show more

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Cited by 69 publications
(21 citation statements)
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“…In this Letter, we report a higher reactivity of ozone with its concentration >80% 4) as an alternative oxidant than molecular oxygen to synthesize an ultrathin silicon oxide film by investigating its growth kinetics by Si 2p X-ray photoelectron spectroscopy (XPS) and by comparing it with that of oxygen. A significant feature is presented for growth kinetics modes of oxide films by ozone on Si(100)2×1 with their thickness above and below 0.6 nm and on a substrate heated above 550 • C or below 500 • C. Here, we show a clear transition of the initial oxide growth kinetics due to ozone from the adsorption mode to the ultrathin oxide growth mode.…”
mentioning
confidence: 96%
See 1 more Smart Citation
“…In this Letter, we report a higher reactivity of ozone with its concentration >80% 4) as an alternative oxidant than molecular oxygen to synthesize an ultrathin silicon oxide film by investigating its growth kinetics by Si 2p X-ray photoelectron spectroscopy (XPS) and by comparing it with that of oxygen. A significant feature is presented for growth kinetics modes of oxide films by ozone on Si(100)2×1 with their thickness above and below 0.6 nm and on a substrate heated above 550 • C or below 500 • C. Here, we show a clear transition of the initial oxide growth kinetics due to ozone from the adsorption mode to the ultrathin oxide growth mode.…”
mentioning
confidence: 96%
“…Next, we exposed this clean Si(100)2×1 at a fixed temperature to highly concentrated ozone gas at reduced pressure in the UHV chamber. This ozone gas was supplied using an ozone jet generator system described in detail elsewhere: 4) The system consists of a conventional ozonizer by electric discharge which produces about 5 at% ozone/oxygen mixture gas and a cold vessel which isolates ozone from oxygen in the mixture gas by liquefying only ozone at 90 K and evacuating oxygen. Finally, saturated ozone vapor in this cold vessel XPS peaks due to an ultrathin oxide film growth in the presence of ozone.…”
mentioning
confidence: 99%
“…The measurement of electric properties of the film may reveal the existence of such layers; this is left for further study. Because the XPS spectra were stable for all samples, we investigated the oxide film growth by ozone using Eqn (2). Figure 3 shows the dependence of the oxide film thickness, estimated using Eqn (2), on the time of exposure to the ozone gas at a sample temperature of ¾200°C ( ž ).…”
Section: Resultsmentioning
confidence: 99%
“…Using a high-purity (>80%) ozone jet supplied by an ozone generator, 2,3 we examined the formation of an ultrathin SiO 2 film on Si(111) and Si(100) substrates. This examination revealed several superior features of ozone in the oxidation of Si.…”
Section: Introductionmentioning
confidence: 99%
“…The ~100% ozone used in these experiments was supplied by a pure ozone generator (Type: MPOGSM1C1; Meidensha Corp., Japan). [2][3][4][5] The use of pure ozone reduces the activation energy for Si oxidation from 0.81 eV for O2 to 0.34 eV, resulting in a reaction temperature as low as 410 C. 6 Below 410 C, the Si oxidation rate decreases abruptly owing to the lack of atomic oxygen in the ground state, O( 3 P), which is produced by the thermal decomposition of ozone. The reactivity of ozone can be further enhanced by photoexcitation using ultraviolet (UV) light, which illuminates the Hartley bands (200 to 300 nm) to produce atomic oxygen in an excited state, O( 1 D).…”
Section: Introductionmentioning
confidence: 99%